IP Library Assignment 018489/0114
Patent Assignment
Reel/Frame 018489/0114

Assignment of Assignor's Interest

Recorded: 2006-10-31 Pages: 2
Assignor
NIKAWA, KIYOSHI
Executed: 2006-10-24
Assignee
NEC ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA 211-8668, JAPAN
Covered Property (1)
Non-Destructive Testing Apparatus and Non-Destructive Testing Method
Patent: 7,495,449 →
Application: 11/589,949 →
Publication: US 2007/0115003
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Nov 5, 2010
From: NEC ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 025315/0201 →