IP Library › Assignment 025315/0201
Patent Assignment
Reel/Frame 025315/0201

CHANGE OF NAME

Recorded: 2010-11-05 Received: 2010-11-05 Pages: 9
Assignor
NEC ELECTRONICS CORPORATION
Executed: 2010-04-01
Assignee
RENESAS ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU,, KAWASAKI-SHI, KANAGAWA, JPX, 211-8668, JAPAN
Covered Applications (95)
APPARATUS AND METHOD FOR THROTTLE CONTROL OF INTERNAL COMBUSTION ENGINES
App. No. 12/510,506
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SURFACE CONFIGURATIONS FOR DAMPING INSERTS
App. No. 12/272,164
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SEMICONDUCTOR INTEGRATED CIRCUIT
App. No. 11/626,574
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STALLING PROCESSOR PIPELINE FOR SYNCHRONIZATION WITH COPROCESSOR RECONFIGURED TO ACCOMMODATE HIGHER FREQUENCY OPERATION RESULTING IN ADDITIONAL NUMBER OF PIPELINE STAGES
App. No. 11/625,639
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SEMICONDUCTOR MEMORY DEVICE
App. No. 11/623,649
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DECODING DEVICE, DECODING METHOD , AND RECEIVING APPARATUS
App. No. 11/622,780
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SEMICONDUCTOR DEVICE WITH FIN-TYPE FIELD EFFECT TRANSISTOR AND MANUFACTURING METHOD THEREOF
App. No. 11/632,352
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DATA CONVERTING CIRCUIT AND DISPLAY APPARATUS USING THE SAME
App. No. 11/620,285
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LEADLESS TYPE SEMICONDUCTOR PACKAGE, AND PRODUCTION PROCESS FOR MANUFACTURING SUCH LEADLESS TYPE SEMICONDUCTOR PACKAGE
App. No. 11/620,481
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COMMUNICATION SYSTEM, COMMUNICATION APPARATUS, AND COMMUNICATION QUALITY TEST METHOD
App. No. 11/620,305
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METHOD FOR FABRICATING AN ESD PROTECTION APPARATUS FOR DISCHARGING ELECTRIC CHARGE IN A DEPTH DIRECTION
App. No. 11/649,211
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BURN-IN TEST CIRCUIT, BURN-IN TEST METHOD, BURN-IN TEST APPARATUS, AND A BURN-IN TEST PATTERN GENERATION PROGRAM PRODUCT
App. No. 11/619,954
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DISPLAY CONTROL DEVICE
App. No. 11/619,977
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MICROCONTROLLER AND AUTHENTICATION METHOD BETWEEN THE CONTROLLERS
App. No. 11/648,691
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Apparatus and method for transition point detection, recording apparatus and record playback apparatus
App. No. 11/648,543
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DIFFERENTIAL AMPLIFIER, DATA DRIVER AND DISPLAY DEVICE
App. No. 11/648,530
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Semiconductor device having a heatsink plate with bored portions
App. No. 11/648,539
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SEMICONDUCTOR METHOD HAVING SILICON-DIFFUSED METAL WIRING LAYER
App. No. 11/647,187
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Microcomputer, method for writing program to microcomputer, and writing system
App. No. 11/645,665
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DIFFERENTIAL AMPLIFIER AND DISPLAY DEVICE USING THE SAME
App. No. 11/645,612
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INFORMATION PROCESSING APPARATUS AND METHOD FOR USING RECONFIGURABLE DEVICE
App. No. 11/616,751
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ELECTRONIC DEVICE SUBSTRATE, ELECTRONIC DEVICE AND METHODS FOR MAKING SAME
App. No. 11/645,948
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MEMORY TEST CIRCUIT AND METHOD
App. No. 11/642,898
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METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE OR SEMICONDUCTOR WAFER USING A CHUCKING UNIT
App. No. 11/641,913
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FLASH MEMORY, MEMORY CONTROL CIRCUIT, MICROCOMPUTER AND MEMORY CONTROL METHOD
App. No. 11/641,733
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TRANSPORT FORMAT DETECTING APPARATUS AND METHOD
App. No. 11/613,927
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METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
App. No. 11/640,892
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SOLID-STATE IMAGE PICKUP DEVICE
App. No. 11/641,016
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SEMICONDUCTOR DEVICE INCLUDING CAPACITIVE CIRCUIT AND SHORT-CIRCUIT PREVENTING CIRCUIT CONNECTED IN SERIES
App. No. 11/641,017
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NONVOLATIVE SEMICONDUCTOR MEMORY DEVICE AND OPERATING METHOD THEREOF
App. No. 11/640,486
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TIMING ANALYSIS APPARATUS AND METHOD OF TIMING ANALYSIS
App. No. 11/639,291
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DIFFERENTIAL AMPLIFIER, DATA DRIVER AND DISPLAY DEVICE
App. No. 11/638,535
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METHOD OF PATTERNING MULTIPLE-LAYERED RESIST FILM AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
App. No. 11/638,499
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Laser diode driver
App. No. 11/637,799
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LASER DIODE DRIVER
App. No. 11/637,178
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METAL-INSULATOR-METAL (MIM) CAPACITOR HAVING CAPACITOR DIELECTRIC MATERIAL SELECTED FROM A GROUP CONSISTING OF ZRO2, HFO2, (ZRX, HF1-X)O2 (0<X<1), (ZRy, Ti (O<y<1), (Hfz, Ti-z)O2 (O<z<1) AND (Zrk, Ti1, Hfm)O2 (O<k, 1, m<1, k+1+m=1)
App. No. 11/637,147
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SUPPORT METHOD FOR DESIGNING A SEMICONDUCTOR DEVICE
App. No. 11/636,443
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INTERRUPT CONTROLLER AND INTERRUPT CONTROL METHOD
App. No. 11/635,503
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SEMICONDUCTOR DEVICE HAVING N-CHANNEL TYPE MOS TRANSISTOR WITH GATE ELECTRODE LAYER FEATURING SMALL AVERAGE POLYCRYSTALLINE SILICON GRAIN SIZE
App. No. 11/635,505
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SEMICONDUCTOR DESIGN SUPPORT APPARATUS
App. No. 11/635,661
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SEMICONDUCTOR APPARATUS, SEMICONDUCTOR STORAGE APPARATUS, CONTROL SIGNAL GENERATION METHOD, AND REPLACING METHOD
App. No. 11/634,955
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ARITHMETIC CIRCUIT
App. No. 11/634,957
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DISPLAY PANEL DRIVER FOR REDUCING HEAT GENERATION THEREIN
App. No. 11/608,043
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SEMICONDUCTOR INTEGRATED CIRCUIT AND METHOD FOR CONTROLLING THE SAME
App. No. 11/634,081
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SOLID STATE IMAGING DEVICE INCLUDING A LIGHT RECEIVING PORTION WITH A SILICIDED SURFACE
App. No. 11/634,084
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CURRENT SOURCE CELL ARRANGEMENT AND DIGITAL-TO-ANALOG CONVERTER
App. No. 11/634,249
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PROBE TEST APPARATUS
App. No. 11/634,257
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Memory controller and memory control method
App. No. 11/634,120
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METHOD OF CLEANING PLASMA ETCHING APPARATUS, AND THUS-CLEANABLE PLASMA ETCHING APPARATUS
App. No. 11/633,530
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SEMICONDUCTOR WAFER AND SEMICONDUCTOR DEVICE, AND METHOD FOR MANUFACTURING SAME
App. No. 11/633,502
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Processor apparatus including specific signal processor core capable of dynamically scheduling tasks and its task control method
App. No. 11/607,888
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SEMICONDUCTOR INTEGRATED CIRCUIT AND METHOD OF MANUFACTURING THE SAME
App. No. 11/607,000
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Semiconductor device
App. No. 11/607,009
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SEMICONDUCTOR LIGHT RECEIVING ELEMENT AND OPTICAL PICK-UP DEVICE HAVING THE SEMICONDUCTOR LIGHT RECEIVING ELEMENT
App. No. 11/607,013
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SEMICONDUCTOR DEVICE WITH METAL NITRIDE BARRIER LAYER BETWEEN GATE DIELECTRIC AND SILICIDED, METALLIC GATE ELECTRODES
App. No. 11/606,034
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EEPROM
App. No. 11/604,290
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METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
App. No. 11/602,180
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APPARATUS FOR MONITORING THE VOLTAGE OF A BATTERY PACK HAVING A PLURALITY OF BATTERY CELLS CONNECTED IN SERIES
App. No. 11/601,636
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SEMICONDUCTOR WAFER POLISHING APPARATUS, AND METHOD OF POLISHING SEMICONDUCTOR WAFER
App. No. 11/600,857
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SMALL-SIZED SEMICONDUCTOR DEVICE FEATURING PROTECTION CIRCUIT FOR MOSFET
App. No. 11/600,826
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METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
App. No. 11/600,057
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METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
App. No. 11/600,071
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SEMICONDUCTOR INTEGRATED CIRCUIT INCLUDING FUSE CIRCUIT AND METHOD OF MANUFACTURING THE SAME
App. No. 11/599,293
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IMAGE PROCESSING METHOD, IMAGE PROCESSING APPARATUS, AND IMAGE PICKUP APPARATUS HAVING FIRST AND SECOND EXPOSURE VALUES
App. No. 11/598,688
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SEMICONDUCTOR MEMORY DEVICE FOR ACHIEVING HIGH RELIABILITY WITHOUT INCREASING PROCESS COMPLEXITY AND COST
App. No. 11/598,713
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MOTOR CONTROLLING CIRCUIT AND METHOD
App. No. 11/598,739
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SEMICONDUCTOR INTEGRATED CIRCUIT FOR MINIMIZING A DEVIATION OF AN INTERNAL POWER SUPPLY FROM A DESIRED VALUE
App. No. 11/598,038
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SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
App. No. 11/594,723
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METHOD OF FORMING PATTERN
App. No. 11/593,543
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EVAPORATOR FEATURING ANNULAR RIDGE MEMBER PROVIDED ON SIDE WALL SURFACE OF EVAPORATING CHAMBER
App. No. 11/593,110
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SOI SUBSTRATE AND METHOD OF MANUFACTURING THE SAME
App. No. 11/593,013
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SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE MINIMIZING LEAKAGE CURRENT
App. No. 11/592,978
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SEMICONDUCTOR STORAGE DEVICE EQUIPPED WITH ECC FUNCTION
App. No. 11/593,012
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A TEACHING APPARATUS AND METHOD OF TEACHING A WAFER CARRYING APPARATUS A TARGET POSITION FOR PLACING AND REMOVING SEMICONDUCTOR WAFERS ON AND OFF A WAFER BOAT USING AN IMAGING DEVICE AND DISTANCE SENSOR
App. No. 11/592,244
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FIELD EFFECT TRANSISTOR HAVING CONTACT PLUGS IN THE SOURCE REGION GREATER THAN IN THE DRAIN REGION
App. No. 11/591,549
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METHOD FOR MANUFACTURING A SEMICONDUCTOR DEVICE HAVING A MULTI-LAYERED INSULATING STRUCTURE OF SiOCH LAYERS AND AN SiO2 LAYER
App. No. 11/591,704
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SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME
App. No. 11/591,573
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CONSTANT VOLTAGE GENERATING APPARATUS WITH SIMPLE OVERCURRENT/SHORT-CIRCUIT PROTECTION CIRCUIT
App. No. 11/591,518
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LAYOUT DESIGN METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT HAVING WELL SUPPLIED WITH POTENTIAL DIFFERENT FROM SUBSTRATE POTENTIAL.
App. No. 11/591,550
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Semiconductor device, method of forming wiring pattern, and method of generating mask wiring data
App. No. 11/590,846
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IMAGE STABILIZATION APPARATUS, METHOD THEREOF, AND PROGRAM PRODUCT THEREOF
App. No. 11/590,815
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SEMICONDUCTOR DEVICE
App. No. 11/590,847
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DECODING DEVICE, DECODING METHOD, AND RECEIVING APPARATUS
App. No. 11/590,823
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NON-DESTRUCTIVE TESTING APPARATUS AND NON-DESTRUCTIVE TESTING METHOD
App. No. 11/589,949
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SEMICONDUCTOR DEVICE INCLUDING A PARTICULAR DUMMY TERMINAL
App. No. 11/589,180
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SEMICONDUCTOR DEVICE, LAYOUT METHOD AND APPARATUS AND PROGRAM
App. No. 11/589,241
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OPERATIONAL AMPLIFIER, INTEGRATING CIRCUIT, FEEDBACK AMPLIFIER, AND CONTROLLING METHOD OF THE FEEDBACK AMPLIFIER
App. No. 11/589,238
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DRIVER DEVICE OF PLASMA DISPLAY PANEL
App. No. 11/589,187
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DELAY LOCKED LOOP CIRCUIT
App. No. 11/588,256
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SEMICONDUCTOR DEVICE FEATURING ELECTRODE TERMINALS FORMING SUPERIOR HEAT-RADIATION SYSTEM
App. No. 11/588,347
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DLL CIRCUIT AND TEST METHOD THEREOF
App. No. 11/588,403
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CIRCUIT DESIGN SYSTEM AND CIRCUIT DESIGN PROGRAM
App. No. 11/588,372
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SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE, AND DEBUGGING SYSTEM AND METHOD FOR THE SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
App. No. 11/586,505
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SEMICONDUCTOR DEVICE
App. No. 11/585,167
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METHOD AND SYSTEM FOR DYNAMIC NAMETAG SCORING
App. No. 11/336,081
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