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App. No. 11/619,954 · Confirmation No. 8396

BURN-IN TEST CIRCUIT, BURN-IN TEST METHOD, BURN-IN TEST APPARATUS, AND A BURN-IN TEST PATTERN GENERATION PROGRAM PRODUCT

Inventor: Eiji HARADA
Patent Expired Due to NonPayment of Maintenance Fees Under 37 CFR 1.362 View Patent ↗ View Publication ↗
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Quick Facts
App. No.
11/619,954
Filed
2007-01-04
Granted
2011-01-18
Pub. No.
US20070168804A1
Examiner
TON, DAVID
Art Unit
2117
PTA
0 days