Patent Assignment
Reel/Frame 018710/0156
Assignment of Assignor's Interest
Recorded: 2007-01-04
Received: 2007-01-04
Pages: 2
Assignor
HARADA, EIJI
Executed: 2006-12-20
Assignee
NEC ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA, JPX, 211-8668, JAPAN
Covered Property
(1)
Burn-In Test Circuit, Burn-in Test Method, Burn-in Test Apparatus, and a Burn-in Test Pattern Generation Program Product
Application:
11/619,954 →