Patent Assignment
Reel/Frame 018581/0470
Assignment of Assignor's Interest
Recorded: 2006-11-29
Pages: 2
Assignors
KURENUMA, TOORU
Executed: 2006-02-06
YANAGIMOTO, HIROAKI
Executed: 2006-02-06
KURODA, HIROSHI
Executed: 2006-02-06
MINOMOTO, YASUSHI
Executed: 2006-02-06
MIWA, SHIGERU
Executed: 2006-02-06
MURAYAMA, KEN
Executed: 2006-02-06
KENBOU, YUKIO
Executed: 2006-02-06
KUNITOMO, YUUICHI
Executed: 2006-02-06
HIROKI, TAKENORI
Executed: 2006-02-06
NAGANO, YOSHIYUKI
Executed: 2006-02-06
MORIMOTO, TAKAFUMI
Executed: 2006-02-06
Assignee
HITACHI KENKI FINE TECH. CO., LTD.
19-11, YUSHIMA 3-CHOME, BUNKYO-KU, TOKYO, JAPAN
Covered Property
(1)
Scanning Type Probe Microscope and Probe Moving Control Method Therefor