Patent Assignment
Reel/Frame 018593/0523
Assignment of Assignor's Interest
Recorded: 2006-11-06
Pages: 3
Assignee
OMRON CORPORATION
801 MINAMIFUDODO-CHO, HORIKAWAHIGASHIIRUM SHIOKOJI-DORI, SHIMOGYO-KU, KYOTO 600-8530, JAPAN
Covered Property
(1)
Substrate Inspection System Including a Visual Inspection Device for Inspection by Image Processing