Patent Assignment
Reel/Frame 018693/0203
Assignment of Assignor's Interest
Recorded: 2006-12-29
Pages: 3
Assignors
KANEDA, MITSURU
Executed: 2006-12-14
TAKAHASHI, HIDEKI
Executed: 2006-12-14
TOMOMATSU, YOSHIFUMI
Executed: 2006-12-14
Assignee
MITSUBISHI ELECTRIC CORPORATION
7-3, MARUNOUCHI 2-CHOME, CHIYODA-KU, TOKYO, 100-8310, JAPAN
Covered Property
(1)
Semiconductor Device Preventing Recovery Breakdown and Manufacturing Method Thereof