Patent Assignment
Reel/Frame 018776/0197
Assignment of Assignor's Interest
Recorded: 2007-01-04
Pages: 2
Assignor
HARADA, EIJI
Executed: 2006-12-14
Assignee
NEC ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA, 211-8668, JAPAN
Covered Property
(1)
Semiconductor Testing System and Testing Method
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.