Patent Assignment
Reel/Frame 018796/0364
Assignment of Assignor's Interest
Recorded: 2007-01-11
Pages: 3
Assignee
SAMSUNG ELECTRONICS CO., LTD.
416, MAETAN-DONG, YEONGTONG-GU, SUWON-SI, GYEONGGI-DO, KOREA, REPUBLIC OF
Covered Property
(1)
Semiconductor Device Generating a Test Voltage for a Wafer Burn-in Test and Method Thereof