IP Library › Assignment 018800/0103
Patent Assignment
Reel/Frame 018800/0103

Assignment of Assignor's Interest

Recorded: 2007-01-12 Pages: 2
Assignors
TOYODA, YASUTAKA
Executed: 2006-10-26
SUTANI, TAKUMICHI
Executed: 2006-10-26
MATSUOKA, RYOICHI
Executed: 2006-10-26
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
1-24-14, NISHI SHIMBASHI, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Pattern Matching Apparatus and Semiconductor Inspection System Using the Same
Patent: 7,991,218 →
Application: 11/588,418 →
Publication: US 2007/0098248
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →