IP Library › Assignment 018808/0918
Patent Assignment
Reel/Frame 018808/0918

Assignment of Assignor's Interest

Recorded: 2007-01-16 Pages: 2
Assignors
SAITO, KEIYA
Executed: 2006-11-30
WATANABE, MASAHIRO
Executed: 2006-11-30
YOSHITAKE, YASUHIRO
Executed: 2006-11-30
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
16-3, HIGASHI 3-CHOME, SHIBUYA-KU, TOKYO, JAPAN
Covered Property (1)
Method for Optically Detecting Height of a Specimen and Charged Particle Beam Apparatus Using the Same
Patent: 7,599,076 →
Application: 11/591,563 →
Publication: US 2007/0109557
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →