IP Library › Assignment 018830/0702
Patent Assignment
Reel/Frame 018830/0702

Assignment of Assignor's Interest

Recorded: 2007-01-18 Pages: 2
Assignors
SUZUKI, YUYA
Executed: 2006-12-11
KAMINO, TAKEO
Executed: 2006-12-11
YAGUCHI, TOSHIE
Executed: 2006-12-11
KONNO, MITSURU
Executed: 2006-12-11
OHNISHI, TSUYOSHI
Executed: 2006-12-11
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
1-24-14, NISHI SHIMBASHI, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Focused Ion Beam System and a Method of Sample Preparation and Observation
Patent: 7,612,337 →
Application: 11/654,685 →
Publication: US 2007/0187597
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →