IP Library › Assignment 018830/0851
Patent Assignment
Reel/Frame 018830/0851

Assignment of Assignor's Interest

Recorded: 2007-01-18 Pages: 3
Assignors
NISHIUMI, TOSHIYA
Executed: 2006-10-26
ANDO, KOKI
Executed: 2006-11-07
Assignee
FUJITSU LIMITED
1-1, KAMIKODANAKA 4-CHOME, NAKAHARA-KU, KAWASKI-SHI, KANAGAWA 211-8588, JAPAN
Covered Property (1)
Testing Method for Semiconductor Device, Testing Apparatus Therefor, and Semiconductor Device Suitable for the Test
Patent: 7,465,923 →
Application: 11/654,663 →
Publication: US 2007/0114410
Related Assignments (3)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Dec 5, 2008
From: FUJITSU LIMITED
To: FUJITSU MICROELECTRONICS LIMITED
Reel/Frame 021976/0876 →
Change of Name Aug 2, 2010
From: FUJITSU MICROELECTRONICS LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 024804/0269 →
Change of Address Dec 23, 2016
From: FUJITSU SEMICONDUCTOR LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 041188/0401 →