Testing method for semiconductor device, testing apparatus therefor, and semiconductor device suitable for the test
View Patent ↗The present invention relates to a method of testing, in the manufacturing process of an LSI (large scale integration) device, a result apparatus therefor, and a cross-sectional microstructure of the LSI device. The method includes thinning a semiconductor chip such that the semiconductor chip includes a substrate crystal and a portion added by the manufacturing process, irradiating an electron beam to the semiconductor chip, detecting an electron beam transmitted through the semiconductor chip to thereby obtain an electron beam diffraction image, removing an electron beam diffracted due to the substrate crystal, and comparing, in the electron beam diffraction image, the thickness of grating stripes obtained from the substrate crystal with the thickness of the portion added by the manufacturing process.
1. A measuring method comprising:
a step of producing a sample by thinning an object including a crystal portion;
a step of irradiating an electron beam to the sample and narrowing, to an arbitrary amount, an electron beam which is included in a transmitted electron beam transmitted through the sample and which is diffracted by the crystal portion, to thereby obtain electron beam imaging from the transmitted electron beam; and
a step of comparing, in the electron beam imaging, the width of grating stripes obtained from the crystal portion with the width of an arbitrary portion.
2. The measuring method described in claim 1 ,
wherein, in the step of producing the sample,
the object including the crystal portion is thinned by irradiation of an FIB.
3. The measuring method described in claim 1 ,
characterized in that, in the step of obtaining the electron beam imaging,
the step is performed by using a device which detects the electron beam, and
that a diaphragm provided between the sample and the device which detects the electron beam is made continuously variable,
to thereby narrow, to the arbitrary amount, the electron beam diffracted by the crystal portion.
4. The measuring method described in claim 1 ,
characterized in that, in the step of comparing, in the electron beam imaging, the width of grating stripes obtained from the crystal portion with the width of an arbitrary portion,
the ratio between the width of the grating stripes and the width of the arbitrary portion in the electron beam imaging is further obtained, and
that the actual width of the arbitrary portion is obtained from a grating constant corresponding to the actual grating stripes and from the ratio.
5. A measuring apparatus comprising:
an FIB irradiation device for irradiating an FIB to a measured object from one angle;
an electron beam irradiation device for irradiating an electron beam to the measured object from another angle;
an electron beam detecting device for detecting the electron beam transmitted through the measured object; and
an electron beam diaphragm provided between the electron beam detecting device and the measured object and capable of adjusting an opening through which the electron beam passes;
characterized in that the diaphragm is formed by disposing eight rectangular plates each including a first opening at a central portion thereof such that one rectangular plate of the eight rectangular plates is disposed at an angle of 0 degree and the other rectangular plates are sequentially superimposed each with an angle of 45 degrees, with the first openings partially overlapped with one another, and
that the eight rectangular plates are slid by an equal amount along the respective disposition angles thereof with respect to a second opening formed by a common portion of the first openings of the eight rectangular plates, to thereby adjust the size of the second opening.
6. A measuring apparatus comprising:
an FIB irradiation device for irradiating an FIB to a measured object from a horizontal direction;
an electron beam irradiation device for irradiating an electron beam to the measured object from a vertical direction;
an electron beam detecting device for detecting the electron beam transmitted through the measured object; and
an electron beam diaphragm provided between the electron beam detecting device and the measured object and capable of adjusting an opening through which the electron beam passes;
wherein that the diaphragm is formed by disposing eight rectangular plates each including a first opening at a central portion thereof such that one rectangular plate of the eight rectangular plates is disposed at an angle of 0 degree and the other rectangular plates are sequentially superimposed each with an angle of 45 degrees, with the first openings partially overlapped with one another, and
wherein the eight rectangular plates are slid by an equal amount along the respective disposition angles thereof with respect to a second opening formed by a common portion of the first openings of the eight rectangular plates, to thereby adjust the size of the second opening.