IP Library › Assignment 018843/0120
Patent Assignment
Reel/Frame 018843/0120

Assignment of Assignor's Interest

Recorded: 2007-01-26 Pages: 2
Assignors
HASEGAWA, MASAKI
Executed: 2006-02-14
MURAKOSHI HISAYA
Executed: 2006-02-18
MAKINO, HIROSHI
Executed: 2006-02-19
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14 NISHISHINBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Method and Apparatus for Pattern Inspection
Patent: 7,566,871 →
Application: 11/698,025 →
Publication: US 2007/0272857
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →