IP Library Assignment 018862/0636
Patent Assignment
Reel/Frame 018862/0636

Assignment of Assignor's Interest

Recorded: 2007-02-06 Pages: 10
Assignors
ZELAKIEWICZ, SCOTT STEPHEN
Executed: 2006-03-29
BOGDANOVICH, SNEZANA
Executed: 2006-03-30
COUTURE, AARON JUDY
Executed: 2006-03-30
ALBAGLI, DOUGLAS
Executed: 2006-03-29
HENNESSY, WILLIAM ANDREW
Executed: 2006-03-30
Assignee
GE INSPECTION TECHNOLOGIES, LP
50 INDUSTRIAL PARK ROAD, LEWISTOWN, PENNSYLVANIA, 17044
Covered Property (1)
Diode Design to Reduce the Effects of Radiation Damage
Patent: 7,259,377 →
Application: 11/300,815 →
Publication: US 2007/0138397
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Apr 3, 2006
From: ZELAKIEWICZ, SCOTT STEPHEN; BOGDANOVICH, SNEZANA; COUTURE, AARON JUDY; ALBAGLI, DOUGLAS
To: GENERAL ELECTRIC COMPANY
Reel/Frame 017421/0149 →
Change of Name Dec 1, 2021
From: GE INSPECTION TECHNOLOGIES, LP
To: WAYGATE TECHNOLOGIES USA, LP
Reel/Frame 058292/0450 →