Patent Assignment
Reel/Frame 018928/0868
Assignment of Assignor's Interest
Recorded: 2007-02-23
Pages: 3
Assignor
MITSUHASHI, TAKASHI
Executed: 2007-02-23
Assignee
CADENCE DESIGN SYSTEMS, INC.
2655 SEELY AVENUE, SAN JOSE, CALIFORNIA, 95134
Covered Property
(1)
Method and System for Lithography Simulation and Measurement of Critical Dimensions with Improved Cd Marker Generation and Placement