IP Library › Assignment 018984/0476
Patent Assignment
Reel/Frame 018984/0476

Assignment of Assignor's Interest

Recorded: 2007-02-09 Pages: 2
Assignors
TANIMOTO, SAYAKA
Executed: 2006-12-20
YAMANASHI, HIROMASA
Executed: 2006-12-07
FUKUDA, MUNEYUKI
Executed: 2006-12-07
SOHDA, YASUNARI
Executed: 2006-12-07
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHINBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Charged Particle Beam Apparatus and Pattern Measuring Method
Patent: 7,655,907 →
Application: 11/704,227 →
Publication: US 2007/0272858
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →