IP Library Assignment 018988/0712
Patent Assignment
Reel/Frame 018988/0712

Assignment of Assignor's Interest

Recorded: 2007-02-15 Pages: 3
Assignors
ISHIBASHI, KEIJI
Executed: 2007-02-01
TANAKA, NORIKO
Executed: 2007-01-30
Assignee
SUMITOMO ELECTRIC INDUSTRIES, LTD.
5-33, KITAHAMA 4-CHOME, CHUO-KU, OSAKA-SHI, OSAKA, 541-0041, JAPAN
Covered Property (1)
Method of Measuring Warpage of Rear Surface of Substrate
Patent: 7,494,892 →
Application: 11/706,331 →
Publication: US 2007/0192058