IP Library › Assignment 019097/0383
Patent Assignment
Reel/Frame 019097/0383

Assignment of Assignor's Interest

Recorded: 2007-03-19 Pages: 3
Assignors
ITOH, KOHEI
Executed: 2007-02-22
SHIMIZU, YASUO
Executed: 2007-02-22
Assignee
KEIO UNIVERSITY
15-45, MITA 2-CHOME, MINATO-KU, TOKYO 108-8345, JAPAN
Covered Property (1)
Method of Evaluating Ion Irradiation Effect, Process Simulator and Device Simulator
Patent: 7,800,053 →
Application: 11/723,245 →
Publication: US 2007/0267572