IP Library › Assignment 019110/0172
Patent Assignment
Reel/Frame 019110/0172

Assignment of Assignor's Interest

Recorded: 2007-03-16 Pages: 4
Assignors
HATTORI, TAKASHI
Executed: 2007-02-21
HASHIDUME, YUMIKO
Executed: 2007-02-21
NISHINO, TATSUHIRO
Executed: 2007-02-21
IKEDA, KOUJI
Executed: 2007-02-21
Assignee
NEC ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA, 211-8668, JAPAN
Covered Property (1)
Semiconductor Apparatus and Test Method Therefor
Patent: 7,793,174 →
Application: 11/723,140 →
Publication: US 2007/0245200
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Nov 4, 2010
From: NEC ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 025311/0860 →