Patent Assignment
Reel/Frame 019113/0135
Assignment of Assignor's Interest
Recorded: 2007-04-04
Pages: 4
Assignors
KUROIWA, YOUSUKE
Executed: 2007-01-31
FUKUDA, HIDEO
Executed: 2007-01-31
YAMAGUCHI, HIROSHI
Executed: 2007-01-31
CHATO, TETSUO
Executed: 2007-01-31
SHIMIZU, YUZO
Executed: 2007-01-31
TANIGUCHI, MASAKI
Executed: 2007-01-31
Assignee
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
1006 OAZA KADOMA, KADOMA-SHI, OSAKA, 571-8501, JAPAN
Covered Property
(1)
Test Circuit and Test Method That Includes Supplying a Current to a Plurality of Light-Receiving Elements
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.