Test circuit and test method that includes supplying a current to a plurality of light-receiving elements

1. A test circuit, comprising:

a plurality of light-receiving elements;

a plurality of amplifiers, each of which converts, into a voltage, a photoelectric current supplied from one of said plurality of light-receiving elements;

a test pad to which a voltage is applied from outside; and

an electric current supplier that supplies an electric current to each of said plurality of light-receiving elements and each of said plurality of amplifiers, the electric current corresponding to the voltage applied to said test pad,

wherein said electric current supplier selectively supplies an electric current to a first group of light-receiving elements and to a second group of light-receiving elements, said first group of light-receiving elements including light-receiving elements, out of said plurality of light-receiving elements, which are neither vertically nor horizontally adjacent to each other, and said second group of light-receiving elements including light-receiving elements, out of said plurality of light-receiving elements, which are vertically or horizontally adjacent to said light-receiving elements of said first group of light-receiving elements, so that;

each amplifier, out of said plurality of amplifiers, which converts a photoelectric current supplied from one light-receiving element included in one of said first group of light-receiving elements and said second group of light-receiving elements to which the electric current is supplied outputs a voltage to determine whether said amplifier is operating properly, and

each amplifier, out of said plurality of amplifiers, that convert a photoelectric current supplied from one light-receiving element included in one of said first group of light-receiving elements and said second group of light-receiving elements to which the electric current is not supplied outputs a voltage to determine whether a leak current flows between said plurality of light-receiving elements.

2. The test circuit of claim 1 ,

wherein said electric current supplier includes:

a first electric current supplying subunit that supplies an electric current to said first group of light-receiving elements; and

a second electric current supplying subunit that supplies an electric current to said second group of light-receiving elements,

said first electric current supplying subunit does not supply an electric current while said second electric current supplying subunit supplies an electric current, and

said second electric current supplying subunit does not supply an electric current while said first electric current supplying subunit supplies an electric current.

3. The test circuit of claim 1 ,

wherein said electric current supplier supplies an electric current having a first electric current value to a first light-receiving element included in said first group of light-receiving elements, and supplies an electric current having a second electric current value to a second light-receiving element included in said first group of light-receiving elements.

4. The test circuit of claim 1 ,

wherein said electric current supplier includes:

an electric current supplying subunit operable to output an electric current; and

a plurality of switches, each of which is provided between an output of said electric current supplying subunit, and a pair of one of said plurality of light-receiving elements and one of said plurality of amplifiers.

5. The test circuit of claim 1 , further comprising

a voltage supplier that supplies a first reference voltage to a first group of amplifiers, out of said plurality of amplifiers, which includes amplifiers each of which converts, into a voltage, the photoelectric current supplied from one of said light-receiving elements included in said first group of light-receiving elements; and to supply a second reference voltage to a second group of amplifiers, out of said plurality of amplifiers, which includes amplifiers, each of which converts, into a voltage, the photoelectric current supplied from one of said light-receiving elements included in said second group of light-receiving elements.

6. A test method for testing a plurality of amplifiers, each of which converts, into a voltage, a photoelectric current supplied from one of a plurality of light-receiving elements, said test method comprising:

selectively supplying an electric current to a first group of light-receiving elements and to a second group of light-receiving elements, the first group of light-receiving elements including a plurality of light-receiving elements, out of the plurality of light-receiving elements, which are neither vertically nor horizontally adjacent to each other, and the second group of light-receiving elements including a plurality of light-receiving elements, out of the plurality of light-receiving elements, which are vertically or horizontally adjacent to the light-receiving elements included in the first group of light-receiving elements;

measuring the voltage converted by each of the amplifiers;

judging, based on the voltage converted by each of the amplifiers which converts, into a voltage, the photoelectric current supplied from one of the light-receiving elements included in the first group of light-receiving elements, whether or not each of the amplifiers is properly operating; and

judging a leak current between the plurality of light-receiving elements, based on the voltage converted by each of the amplifiers which converts, into a voltage, the photoelectric current supplied from one of the light-receiving elements included in the second group of light-receiving elements.