Patent Assignment
Reel/Frame 019135/0514
Assignment of Assignor's Interest
Recorded: 2007-04-09
Pages: 4
Assignors
NAKANO, HIROYUKI
Executed: 2007-01-15
HAMAMATSU, AKIRA
Executed: 2007-02-15
UTO, SACHIO
Executed: 2007-01-29
OSHIMA, YOSHIMASA
Executed: 2007-01-26
NISHIYAMA, HIDETOSHI
Executed: 2007-01-30
URANO, YUTA
Executed: 2007-01-16
MAEDA, SHUNJI
Executed: 2007-01-16
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHINBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property
(1)
Apparatus and Method for Inspecting Defects