IP Library › Assignment 019159/0949
Patent Assignment
Reel/Frame 019159/0949

Assignment of Assignor's Interest

Recorded: 2007-04-09 Pages: 3
Assignors
DYBA, MARCUS
Executed: 2007-03-13
GUGEL, HILMAR
Executed: 2007-03-13
Assignee
LEICA MICROSYSTEMS CMS GMBH
ERNST-LEITZ-STRASSE 17-37, D-35578 WETZLAR, GERMANY
Covered Property (1)
Method and Microscope for High Spatial Resolution Examination of Samples
Patent: 7,679,741 →
Application: 11/653,446 →
Publication: US 2007/0206278