Patent Assignment
Reel/Frame 019210/0251
Assignment of Assignor's Interest
Recorded: 2007-04-25
Pages: 2
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHINBASHI, 1-CHOME,, MINATO-KU, TOKYO, JAPAN
Covered Property
(1)
Method for Measuring a Pattern Dimension Using a Scanning Electron Microscope
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.