IP Library › Assignment 019282/0677
Patent Assignment
Reel/Frame 019282/0677

Assignment of Assignor's Interest

Recorded: 2007-05-11 Pages: 3
Assignors
OKUDA, HIROHITO
Executed: 2007-04-26
HIROI, TAKASHI
Executed: 2007-04-26
HASEGAWA, MASAKI
Executed: 2007-04-27
TANAKA, SHIGEYA
Executed: 2007-04-26
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHINBASHI, 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Method and Apparatus for Inspecting Pattern Defects and Mirror Electron Projection Type or Multi-Beam Scanning Type Electron Beam Apparatus
Patent: 7,521,676 →
Application: 11/601,723 →
Publication: US 2007/0194229
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →