Patent Assignment
Reel/Frame 019320/0058
Assignment of Assignor's Interest
Recorded: 2007-05-11
Pages: 3
Assignor
IWASAKI, KOUJI
Executed: 2007-04-06
Assignee
SII NANO TECHNOLOGY INC.
8, NAKASE 1-CHOME, MIHAMA-KU, CHIBA-SHI, CHIBA, 261-8507, JAPAN
Covered Property
(1)
Focused Ion Beam Apparatus and Method of Preparing/Observing Sample
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.