IP Library Assignment 019325/0037
Patent Assignment
Reel/Frame 019325/0037

Assignment of Assignor's Interest

Recorded: 2007-05-15 Pages: 3
Assignor
NAKAMURA, TOSHIHIRO
Executed: 2007-05-02
Assignee
SII NANO TECHNOLOGY INC.
8, NAKASE 1-CHOME, MIHAMA-KU, CHIBA-SHI, CHIBA, 261-8507, JAPAN
Covered Property (1)
Freezing Point Temperature Measuring Method and Temperature Calibrating Method in Differential Scanning Calorimetry
Patent: 7,547,137 →
Application: 11/706,823 →
Publication: US 2007/0242722
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Sep 17, 2014
From: SII NANOTECHNOLOGY INC.
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 033764/0615 →