Patent Assignment
Reel/Frame 019404/0861
Assignment of Assignor's Interest
Recorded: 2007-06-09
Pages: 2
Assignor
JANG, CHAE KYU
Executed: 2007-04-18
Assignee
HYNIX SEMICONDUCTOR INC.
SAN 136-1, AMI-RI, BUBAL-EUB, KYOUNGKI-DO, ICHEON-SI, KOREA, REPUBLIC OF
Covered Property
(1)
Circuit and Method of Testing a Fail in a Memory Device