IP Library › Assignment 019408/0446
Patent Assignment
Reel/Frame 019408/0446

Assignment of Assignor's Interest

Recorded: 2007-06-11 Pages: 2
Assignor
MATANO, TATSUYA
Executed: 2007-04-20
Assignee
ELPIDA MEMORY, INC.
2-1, YAESU 2-CHOME,, CHUO-KU, TOKYO, 104-0028, JAPAN
Covered Property (1)
Semiconductor Device Having a Test-Voltage Generation Circuit
Patent: 7,627,442 →
Application: 11/760,830 →
Publication: US 2007/0296602
Related Assignments (5)
Other recorded transfers of the patent in this record — the chain of ownership.
Security Agreement Jul 29, 2013
From: PS4 LUXCO S.A.R.L.
To: ELPIDA MEMORY INC.
Reel/Frame 032414/0261 →
Assignment of Assignor's Interest May 15, 2014
From: ELPIDA MEMORY, INC.
To: PS4 LUXCO S.A.R.L.
Reel/Frame 032899/0588 →
Change of Name Aug 24, 2016
From: PS5 LUXCO S.A.R.L.
To: LONGITUDE SEMICONDUCTOR S.A.R.L.
Reel/Frame 039793/0880 →
Assignment of Assignor's Interest Aug 24, 2016
From: PS4 LUXCO S.A.R.L.
To: PS5 LUXCO S.A.R.L.
Reel/Frame 039818/0506 →
Assignment of Assignor's Interest Aug 21, 2018
From: LONGITUDE SEMICONDUCTOR S.A.R.L.
To: LONGITUDE LICENSING LIMITED
Reel/Frame 046867/0248 →