Patent Assignment
Reel/Frame 046867/0248
Assignment of Assignor's Interest
Recorded: 2018-08-21
Pages: 284
Assignor
LONGITUDE SEMICONDUCTOR S.A.R.L.
Executed: 2018-07-31
Assignee
LONGITUDE LICENSING LIMITED
BRACKEN ROAD, SANDYFORD, FIRST FLOOR, BLACKTHORN EXCHANGE, DUBLIN, D18 P3Y9, IRELAND
Covered Properties
(499)
Semiconductor Memory Device
Patent:
6,446,227 →
Application:
09/471,285 →
Semiconductor integrated circuit device equipped with power make-up circuit used in burn-in test after packaging and method for testing the same
Patent:
6,333,517 →
Application:
09/480,489 →
A semiconductor integrated circuit device and process for manufacturing the same
Patent:
6,238,961 →
Application:
09/487,599 →
Semiconductor memory test circuit
Patent:
6,191,987 →
Application:
09/490,249 →
Semiconductor memory device
Patent:
6,233,187 →
Application:
09/490,597 →
Semiconductor integrated circuit device
Patent:
6,339,344 →
Application:
09/497,280 →
Semiconductor device and method for manufacturing the same
Patent:
6,313,497 →
Application:
09/504,432 →
Reference voltage generating device and generating method of the same
Patent:
6,337,598 →
Application:
09/515,543 →
Semiconductor storage device
Patent:
6,160,745 →
Application:
09/515,833 →
Semiconductor memory device having a plurality of storage regions
Patent:
6,166,940 →
Application:
09/518,784 →
Semiconductor integrated circuit device
Patent:
6,262,939 →
Application:
09/521,971 →
Semiconductor Device with Copper Wiring Connected to Storage Capacitor
Patent:
6,521,932 →
Application:
09/525,029 →
Semiconductor Integrated Circuit Device
Patent:
6,343,046 →
Application:
09/525,765 →
Burn-In Apparatus for Screening Pluralty of Semiconductor Devices
Patent:
6,459,285 →
Application:
09/525,766 →
Semiconductor Memory Device Having Word Lines Driven by Row Selecting Signal and Column Selecting Signal Lines Arranged Parallel to Each Other
Patent:
6,282,147 →
Application:
09/528,446 →
Semiconductor device
Patent:
6,335,901 →
Application:
09/531,467 →
Semiconductor Device with Circuit for Adjusting Input/Output Terminal Capacitance
Patent:
6,437,629 →
Application:
09/543,333 →
Semiconductor memory device
Patent:
6,272,057 →
Application:
09/545,884 →
Semiconductor memory device
Patent:
6,282,150 →
Application:
09/546,178 →
Semiconductor memory device
Patent:
6,317,377 →
Application:
09/546,915 →
Semiconductor Integrated Circuit Device and the Process of Manufacturing the Same Having Poly-Silicon Plug, Wiring Trenches and Bit Lines Formed in the Wiring Trenches Having a Width Finer Than a Predetermined Size
Semiconductor memory device
Patent:
6,275,423 →
Application:
09/549,715 →
Phase control circuit, semiconductor device and semiconductor memory
Patent:
6,205,086 →
Application:
09/560,724 →
Redundant Address Setting Circuit and Semiconductor Memory Device Including the Same
Patent:
6,697,289 →
Application:
09/561,439 →
Semiconductor device and timing control circuit
Patent:
6,212,127 →
Application:
09/563,160 →
Surface Mount-Type Package of Ball Grid Array with Multi-Chip Mounting
Patent:
6,388,318 →
Application:
09/563,455 →
Semiconductor Device Having a Capacitance Adjustment Section
Patent:
6,417,557 →
Application:
09/568,589 →
Semiconductor memory device in which use of cache can be selected
Patent:
6,381,190 →
Application:
09/568,747 →
Directional Coupling Memory Module
Patent:
6,438,012 →
Application:
09/569,876 →
Semiconductor Device Having Signal Line Above Main Ground or Main Vdd Line, and Manufacturing Method Thereof
Patent:
6,445,018 →
Application:
09/569,945 →
Semiconductor device, testing device thereof and testing method thereof
Patent:
6,356,490 →
Application:
09/570,377 →
Memory module using a vacant pin terminal for balancing parasitic capacitive loads
Patent:
6,266,265 →
Application:
09/572,661 →
Semiconductor device with constant current source circuit not influenced by noise
Patent:
6,348,835 →
Application:
09/578,500 →
Semiconductor Device Having an Internal Power Supply Circuit
Patent:
6,480,053 →
Application:
09/587,474 →
Chip-Size Integrated Circuit Package Having Slits Formed in an Insulator Tape
Patent:
6,476,482 →
Application:
09/588,189 →
Semiconductor storage device
Patent:
6,330,198 →
Application:
09/590,239 →
Semiconductor Intergrated Circuit Device and a Method of Manufacture Thereof
Patent:
6,621,110 →
Application:
09/592,648 →
Semiconductor memory having a redundancy judgment circuit
Patent:
6,269,034 →
Application:
09/593,210 →
Synchronous type semiconductor memory system with less power consumption
Patent:
6,240,048 →
Application:
09/603,508 →
Input initial stage circuit for semiconductor memory
Patent:
6,278,652 →
Application:
09/617,554 →
Semiconductor Memory Device
Patent:
6,269,031 →
Application:
09/619,644 →
Semiconductor memory device
Patent:
6,285,606 →
Application:
09/621,705 →
Cycle selection circuit and semiconductor memory storage using the same
Patent:
6,316,963 →
Application:
09/630,406 →
Semiconductor Memory Apparatus That Can Prevent Write Level of Data to Memory Cell from Dropping and Improve Sense Speed at Next Cycle
Patent:
6,504,782 →
Application:
09/633,133 →
Method of Forming a Misfet Device with a Bit Line Completely Surrounded by Dielectric
Patent:
6,287,914 →
Application:
09/640,013 →
Dynamic Random Access Memory (Dram) Capable of Canceling Out Complementary Noise Developed in Plate Electrodes of Memory Cell Capacitors
Patent:
6,501,672 →
Application:
09/656,477 →
Semiconductor Device and Manufacturing Method Thereof
Patent:
6,545,360 →
Application:
09/657,839 →
Semiconductor Device and Method of Manufacturing the Same
Patent:
6,518,627 →
Application:
09/658,408 →
Method of Manufacturing Semiconductor Integrated Circuit Device Having Insulatro Film Formed from Liquid Containing Polymer of Silicon, Oxygen, and Hydrogen
Patent:
6,509,277 →
Application:
09/664,381 →
Phase control circuit, semiconductor device and semiconductor memory
Patent:
6,222,792 →
Application:
09/666,598 →
Semiconductor memory device
Patent:
6,335,889 →
Application:
09/688,797 →
Semiconductor Memory Device of Ddr Configuration Having Improvement in Glitch Immunity
Patent:
6,407,963 →
Application:
09/689,664 →
Method of Manufacture for Semiconductor Devices
Patent:
6,391,702 →
Application:
09/698,807 →
Dynamic Ram and Semiconductor Device
Patent:
6,370,054 →
Application:
09/705,837 →
Dram Having a Reduced Chip Size
Patent:
6,396,763 →
Application:
09/708,656 →
Process for Manufacture of Micro Electromechanical Devices Having High Electrical Isolation
Patent:
6,617,657 →
Application:
09/710,326 →
Semiconductor Device
Patent:
6,384,343 →
Application:
09/724,195 →
Semiconductor Memory Device Using Open Data Line Arrangement
Logical Circuit for Serializing and Outputting a Plurality of Signal Bits Simulatneously Read from a Memory Cell Array or the Like
Data Latch Circuit and Driving Method Thereof
Semiconductor Storage Device Having Redundancy Circuit for Replacement of Defect Cells Under Tests
Virtual channel synchronous dynamic random access memory
Semiconductor Memory Device with a Triple Well Structure
Process for Multilayer Wiring Connections and Bonding Pad Adhesion to Dielectric in a Semiconductor Integrated Circuit Device
Semiconductor Capacitor Device
Semiconductor Integrated Circuit Device and Process for Manufacturing the Same
Semiconductor Memory Device Having a Rebundant Block and Reduced Power Consumption
Method of Manufacturing Semiconductor Devices Utilizing Underlayer-Dependency of Deposition of Capacitor Electrode Film, and Semiconductor Device
Semiconductor Device and a Method of Manufacturing the Same
Microelectromechanical System (Mems) Digital Electrical Isolator
Semiconductor Memory Device with Improved Column Selecting Operation
Delay Circuit
Circuit Module
Memory System
High Speed Access Compatible Memory Module
Dynamic Ram and Semiconductor Device
Microelectricalmechanical System (Mems) Electrical Isolator with Reduced Sensitivity to Inertial Noise
Semiconductor Device Having a Capacitor Structure Including a Self-Alignment Deposition Preventing Film
Semiconductor Memory
Method of Manufacturing Semiconductor Devices Utilizing Underlayer-Dependency of Deposition of Capacitor Electrode Film, and Semiconductor Device
A Semiconductor Memory Device Having Improved Arrangement for Replacing Failed Bit Lines
Semiconductor Memory
Semiconductor Storage Device
Semiconductor device manufacturing system and method of manufacturing semiconductor devices
Semiconductor Memory Device with a Refresh Function
Method of Manufacturing Semiconductor Device
Semiconductor Memory and Method of Saving Energy of the Memory
Dll Circuit, Semiconductor Device Using the Same and Delay Control Method
Semiconductor Memory Device Having a Word Line Activation Block
Differential Amplifier Circuit with Offset Circuit
Memory device with booting circuit capable of pre-booting before wordline selection
Semiconductor Memory Device Having a Test Mode Decision Circuit
Semiconductor Integrated Circuit Device
Method of Dram
Method for Fabricating an Isolated Microelectromechanical System (Mems) Device Incorporating a Wafer Level Cap
Semiconductor Memory Device
Semiconductor Device
Substrate Electric Potential Sense Circuit and Substrate Electric Potential Generator Circuit
Synchronous Semiconductor Memory Device
A Semiconductor Memory Device Having a Hierarchial I/O Structure
Semiconductor Integrated Circuit
Semiconductor Memory Device Having Fewer Memory Cell Plates Being Activated in a Test Mode Than in a Normal Mode
Block Arrangement for Semiconductor Memory Apparatus
Semiconductor Memory Device
Semiconductor Apparatus
Process of Manufacturing Semiconductor Integrated Circuit Device Having an Amorphous Silicon Gate
Output Buffer Circuit
Semiconductor Memory Device and Control Method
Semiconductor Device
Dll Circuit and Dll Control Method
Semiconductor Memory Device
Semiconductor Memory Device
Semiconductor Memory Device and Method for Accessing Memory Cell
Data Storing Method of Dynamic Ram and Semiconductor Memory Device
Semiconductor Device
Semiconductor Integrated Circuit and Operating Method
Semiconductor Integrated Circuit
Semiconductor Device and Method for Manufacturing the Same
Method for Constructing an Isolate Microelectromechanical System (Mems) Device Using Surface Fabrication Techniques
Method of Manufacturing a Semiconductor Integrated Circuit Device
Semiconductor Device
Magnetic Field Sensor Using Microelectromechanical System
Semiconductor Device and Method for Its Manufacture
Semiconductor Integrated Circuit Device Having Bidirectional Data Transfer Between a Main Memory Unit and an Auxiliary Memory Unit
Semiconductor Memory Device and Method for Its Test
Mems-Based Electrically Isolated Analog-to-Digital Converter
Method for Testing Semiconductor Integrated Circuit Device Equipped with Power Make-Up Circuit Used in Burn-in Test
Semiconductor Integrated Circuit Device
Semiconductor Device Including an Insulated Gate Field Effect Transistor and Method of Manufacturing the Same
Semiconductor Device and Its Manufacturing Method
Method for Fabricating an Isolated Microelectromechanical System Device
Method and Apparatus for Data Transmission and Reception
A Semiconductor Device Comprising Thin Film Transistor Comprising Conductive Film Having Tapered Edge
Semiconductor Device
Semiconductor Device
Semiconductor Integrated Circuit Device
Sense Amplifiers Having Reduced Vth Deviation
Sense Amplifier Arrangement for Semiconductor Memory Device
Data Transmission System and Data Transmission Apparatus
Semiconductor Memory Device and Its Operation Method
Method of Appraising a Dielectric Film, Method of Calibrating Temperature of a Heat Treatment Device, and Method of Fabricating a Semiconductor Memory Device
Dynamic Ram-and Semiconductor Device
Semiconductor Device
Semiconductor Memory Device
Memory Module Including Module Data Wirings Available as a Memory Access Data Bus
Semiconductor Device and Its Manufacturing Method
Semiconductor Memory Device with Single Clock Signal Line
Method for Making Semiconductor Integrated Circuits
Semiconductor Device
Method of Manufacturing a Semiconductor Device Having Signal Line Above Main Ground or Main Vdd Line
Method of Removing Silicon Nitride Film Formed on a Surface of a Material with a Process Gas Containing a Higher-Order Fluorocarbon in Combination with a Lower-Order Fluorocarbon
Semiconductor Storage Device Having Redundancy Circuit for Replacement of Defect Cells Under Tests
A Semiconductor Memory Including a Circuit for Selecting Redundant Memory Cells
Semiconductor Device
Semiconductor Storage Unit
Memory System
Semiconductor Device and a Method of Manufacturing the Same
Booster Circuit Capable of Switching Between a Conventional Mode and a Low Consumption Current Mode
Memory Module
Register Capable of Corresponding to Wide Frequency Band and Signal Generating Method Using the Same
Register Without Restriction of Number of Mounted Memory Devices and Memory Module Having the Same
Method of Manufacturing Semiconductor Device
Calibration Method and Memory System
Method of Manufacturing Semiconductor Devices Utilizing Underlayer-Dependency of Deposition of Capacitor Electrode Film, and Semiconductor Device
Semiconductor Device with External Terminals Arranged Symmetrically with Respect to a Normal External Terminal Arrangement
Semiconductor Device and Timing Control Circuit
Patent:
40,205 →
Application:
10/226,019 →
Semiconductor Apparatus Capable of Preventing Occurrence of Multiple Reflection, Driving Method, and Setting Method Thereof
Memory Device and Memory System
Power Controlling Method for Semiconductor Storage Device and Semiconductor Storage Device Employing Same
Semiconductor Memory Device with Less Data Transfer Delay Time
Semiconductor Memory Device Control Method and Semiconductor Memory Device
Memory Device
Interpolating Circuit, Dll Circuit and Semiconductor Integrated Circuit
Semiconductor Device with Double Sidewall Spacer and Layered Contact
Method, Memory System and Memory Module Board for Avoiding Local Incoordination of Impedance Around Memory Chips on the Memory System
Semiconductor Device Using Shallow Trench Isolation and Method of Fabricating the Same
Input/Output Circuit, Reference-Voltage Generating Circuit, and Semiconductor Integrated Circuit
Method of Controlling Data Reading Capable of Increasing Data Transfer Rate in Sdram of the Posted Cas Standard
Semiconductor Memory Device for Realizing External 8K Ref/Internal 4K Ref Standard Without Lengthening the Refresh Cycle
Semiconductor Integrated Circuit Device
Semiconductor Storage Device and Method for Remedying Defects of Memory Cells
Unbuffered Memory System
Dynamic Random Access Memeory (Dram) Capable of Canceling Out Complementary Noise Developed in Plate Electrodes of Memory Cell Capacitors
Semiconductor Memory Device Capable of Improving Quality of Voltage Waveform Given in a Signal Interconnection Layer
Semiconductor Integrated Circuit
Method of Designing Semiconductor Integrated Circuit Device and Semiconductor Integrated Circuit Device Manufactured Using the Same
Semiconductor Device
Data Writing Method and Memory System for Using the Method
Dynamic Ram-and Semiconductor Device
Boosted Potential Generation Circuit and Control Method
Input Buffer Circuit and Semiconductor Memory Device
Semiconductor Integrated Circuit Device and Process for Manufacturing the Same
Package for Mounting Semiconductor Device
Method of Checking the State of a Capacitor Fuse in Which the Voltage Applied to the Capacitor Fuse Is the Same Level as Voltage Applied to Memory Cells
Semiconductor Integrated Circuit Device
Dll Circuit Capable of Preventing Locking in an Antiphase State
Memory System, Module and Register
Defective Cell Remedy Method Capable of Automatically Cutting Capacitor Fuses Within the Fabrication Process
Semiconductor Device and Its Manufacturing Method
Semiconductor Memory Device and Method of Controlling the Same
Semiconductor Memory Device
Semiconductor Apparatus Which Prevents Generating Noise and Being Influenced by Noise
Vertical Misfet Manufacturing Method, Vertical Misfet, Semiconductor Memory Device Manufacturing Method, and Semiconductor Memory Device
Sense Amplifier for Semiconductor Memory Device
Semiconductor Memory Device Provided with Error Correcting Code Circuitry
Semiconductor Device and Its Manufacturing Method
Method of Recovering Memory Module, Memory Module and Volatile Memory
Method and Circuit for Charging a Signal Voltage Through a Semiconductor Memory Device
Dynamic Ram-and Semiconductor Device
A Semiconductor Memory Device Having Improved Arrangement for Replacing Failed Bit Lines
Memory Module and Memory System Having an Expandable Signal Transmission, Increased Signal Transmission and/or High Capacity Memory
Ald Process for Capacitor Dielectric
Semiconductor Integrated Circuit Device and a Method of Manufacture Thereof
Memory System and Data Transmission Method
Semiconductor Device and Method of Producing the Same
Semiconductor Memory Device Having a Hierarchical I/O Structure
Semiconductor Device Using Current Mirror Circuit
Semiconductor Memory Device Using Open Data Line Arrangement
Data Inversion Circuit and Semiconductor Device
Dram with Super Self-Refresh and Error Correction for Extended Period Between Refresh Operations
Semiconductor Device Using Shallow Trench Isolation and Method of Fabricating the Same
Semiconductor Device and a Method of Manufacturing the Same
Semiconductor Integrated Circuit Device and the Process of Manufacturing the Same Having Poly-Silicon Plug, Wiring Trenches and Bit Lines Formed in the Wiring Trenches Having a Width Finer Than a Predetermined Size
Manufacturing Method of Semiconductor Device
A Memory with Memory Cells That Include a Mim Type Capacitor with a Lower Electrode Made for Reduced Resistance at an Interface with a Metal Film
Method for Forming a Metal Oxide Film
Method of Deciding Error Rate and Semiconductor Integrated Circuit Device
Boosting Circuit and Semiconductor Device Using the Same
Semiconductor Storage Device
Memory Module and Memory System
Semiconductor Module in Which a Semiconductor Package Is Bonded on a Mount Substrate
Method of Manufacturing Semiconductor Device Having Oxide Films with Different Thickness
Semiconductor Memory Device Having a Hierarchical I/O Structure
Dynamic Ram-and Semiconductor Device
Semiconductor Device and Its Manufacturing Method
Semiconductor Memory Device
Dynamic Random Access Memory(Dram) Capable of Canceling Out Complimentary Noise Developed in Plate Electrodes of Memory Cell Capacitors
Method of Manufacturing Semiconductor Device
Antifuse Programming Circuit in Which One Stage of Transistor Is Interposed in a Series with Antifuse Between Power Supplies During Programming
Semiconductor Memory Device and Method for Manufacturing Same
Heat Radiation Device for Memory Module
Semiconductor Memory Device of Hierarchy Word Type and Sub Word Driver Circuit
Semiconductor Device
4N Pre-Fetch Memory Data Transfer System
Semiconductor Device and Manufacturing Method Thereof
Manufacturing Method of Semiconductor Device
Input/Output Circuit, Reference-Voltage Generating Circuit, and Semiconductor Integrated Circuit
Semiconductor Device Having Layered Chips
Semiconductor Circuit Device
Semiconductor Device Having Improved Solder Joint and Internal Lead Lifetimes
Level-Conversion Circuit
Oscillator Circuit Having a Temperature Dependence
Method for Manufacturing a Semiconductor Device Having a W/Wn/Polysilicon Layered Film
Bga Semiconductor Device Having a Dummy Bump
Semiconductor Device and Method of Manufacturing the Same
Word Line Driving Circuit with a Word Line Detection Circuit
Stacked Semiconductor Memory Device
Semiconductor Memory Device
Semiconductor Memory Device
Stacked Semiconductor Device and Semiconductor Memory Module
Refresh Period Generating Circuit
Semiconductor Integrated Circuit Device
Dynamic Random Access Memory (Dram) Capable of Canceling Out Complementary Noise Development in Plate Electrodes of Memory Cell Capacitors
Semiconductor Integrated Circuit Comprising First and Second Transmission Systems
Semiconductor Memory Device and Test Method Therefor
Fuse Circuit and Semiconductor Device Using Fuse Circuit Thereof
Fine Pitch Grid Array Type Semiconductor Device
Mos Transistor in an Active Region
Prevention of the Propagation of Jitters in a Clock Delay Circuit
Semiconductor Memory Device with Column Selecting Switches in Hierarchical Structure
Semiconductor Device and Method of Manufacturing the Same
Semiconductor Memory Device
Semiconductor Integrated Circuit for High-Speed, High-Frequency Signal Transmission
Semiconductor Device Having a Bonding Pad Structure Including an Annular Contact
Semiconductor Device
Pll Circuit
Self-Refresh Timer Circuit and Method of Adjusting Self-Refresh Timer Period
Semiconductor Memory Device with Hierarchical I/O Line Architecture
Semiconductor Memory Device and Method of Making Design Change to Semiconductor Chip
Module
Semiconductor Memory Device
Delay Circuit and Semiconductor Device
Output Circuit for Semiconductor Device, Semiconductor Device Having Output Circuit, and Method of Adjusting Characteristics of Output Circuit
Phase-Change-Type Semiconductor Memory Device
Pll Circuit and Program for Same
Dynamic Random Access Memories and Method for Testing Performance of the Same
Semiconductor Memory Device That Requires Refresh Operations
Semiconductor Memory Device and Stress Testing Method Thereof
Semiconductor Device Having a Mount Board
Semiconductor Chip and Method of Testing the Same
Power Supply Voltage Step-Down Circuit, Delay Circuit, and Semiconductor Device Having the Delay Circuit
Power Supply Circuit
Semiconductor Memory Device
Adjustment of Termination Resistance in an on-Die Termination Circuit
Overdrive Period Control Device and Overdrive Period Determining Method
Semiconductor Memory Device and Semiconductor Memory Device Test Method
Semiconductor Memory Device with Delay Section
Semiconductor Device and a Method of Manufacturing the Same
Semiconductor Storage Device Having a Plurality of Stacked Memory Chips
Data Storing Method of Dynamic Ram and Semiconductor Memory Device
Semiconductor Storage Apparatus
Semiconductor Memory Apparatus and Method for Writing in the Memory
Semiconductor Device and Method of Manufacturing the Same
Semiconductor Device Including a Plurality of Semiconductor Chips and a Plurality of Through-Line Groups
Termination Circuit and Semiconductor Device Comprising That Termination Circuit
Semiconductor Device Having Cell Transistor with Recess Channel Structure
Semiconductor Storage Device
Semiconductor Device
Semiconductor Device and Method for Manufacturing the Same
Duty Ratio Adjustment
Semiconductor Memory Device with Sub-Amplifiers Having a Variable Current Source
Memory Module and Memory System
Redundancy Circuit and Semiconductor Apparatus Having the Redundancy Circuit
Semiconductor Memory Device with No Latch Error
Data transfer operation completion detection circuit and semiconductor memory device provided therewith
Output Control Signal Generating Circuit
Semiconductor Device Including Semiconductor Chip with Two Pad Rows
Semiconductor Device with Latency Counter
Delay Circuit and Delay Synchronization Loop Device
Delay Circuit and Delay Synchronization Loop Device
Memory Bank Arrangement for Stacked Memory
Delay Circuit and Delay Synchronization Loop Device
Voltage Control Circuit and Semiconductor Device Having the Voltage Control Circuit
Semiconductor Memory Device Having Input First-Stage Circuit
Semiconductor Device in Which a Memory Array Is Refreshed Based on an Address Signal
Calibration Circuit and Semiconductor Device Incorporating the Same
Semiconductor Memory Chip with on-Die Termination Function
Synchronous Semiconductor Memory Device
Zq Calibration Circuit and a Semiconductor Device Including a Zq Calibration Circuit
Dll Circuit Feeding Back Zq Calibration Result, and Semiconductor Device Incorporating the Same
Semiconductor Memory
Semiconductor Memory Device
Semiconductor Memory Device
Memory System and Data Transmission Method
Semiconductor Memory Device Having Delay Circuit
Semiconductor Integrated Circuit Device
Semiconductor Chip Having Island Dispersion Structure and Method for Manufacturing the Same
Reference Voltage Generating Circuit
Semiconductor Device Having Trench-Gate Transistor with Parallel Channel Regions in Gate Trench.
Semiconductor Memory Device
Semiconductor Memory Device and Method of Testing the Same
Semiconductor Device
Semiconductor Memory and Memory Module
Memory Module and Memory System
Stacked Semiconductor Device
Semiconductor Storage Device and Refresh Control Method Therefor
Semiconductor Storage Device
Sense Amplifier for Semiconductor Memory Device
Semiconductor Apparatus
Open-Drain Output Circuit
Reference Potential Generating Circuit and Semiconductor Memory Device Having the Same
Semiconductor Integrated Circuit Device and Method of Testing the Same
Stacked Semiconductor Device
Semiconductor Memory Device and Test Method Thereof
System with Controller and Memory
Semiconductor Device Having a Test-Voltage Generation Circuit
Semiconductor Memory Device
Semiconductor Device Having a Sense Amplifier
Nonvolatile Memory Device and Control Method Thereof
Output Circuit for Semiconductor Device, Semiconductor Device Having Output Circuit, and Method of Adjusting Characteristics of Output Circuit
Dynamic Ram-and Semiconductor Device
Semiconductor Integrated Circuit Device with Power Lines Improved
Output Buffer Cirucit and Integrated Semiconductor Circuit Device with Such Output Buffer Circuit
Patent:
43,539 →
Application:
11/798,773 →
Semiconductor Integrated Circuit Device
Semiconductor Device
Semiconductor Device and Method for Manufacturing the Same
Method for Manufacturing a Semiconductor Device Including a Silicon Film
Refresh Period Generating Circuit
Semiconductor Memory Device
Semiconductor Memory Device
Semiconductor Integrated Circuit Device
Process for Manufacturing Semiconductor Device
Semiconductor Device and Memory Circuit Including a Redundancy Arrangement
Level-Conversion Circuit
Stacked Semiconductor Device and Method of Testing the Same
Semiconductor Memory Device and Write Control Method Thereof
Calibration Circuit, Semiconductor Device Including the Same, and Method of Adjusting Output Characteristics of Semiconductor Device
Output Circuit of Semiconductor Device and Semiconductor Device Including Thereof
Semiconductor Device Having a Pseudo Power Supply Wiring
Output Circuit of Semiconductor Device
Semiconductor Memory Device Capable of Relieving Defective Bits Found After Packaging
Semiconductor Device
Delay Circuit and Semiconductor Device
Semiconductor Device and Method of Forming the Same
Semiconductor Memory Device and Method of Testing Same
Semiconductor Device Having a Mount Board
Semiconductor Device and Semiconductor Chips Outputting a Data Strobe Signal
Output Control Signal Generating Circuit
Semiconductor Memory Device Having a Refresh Cycle Changing Circuit
Memory Module and Memory Device
Semiconductor Device Having a Tapered Plug
Voltage Controlled Oscillator
Semiconductor Device and a Method of Manufacturing the Same
Pll Circuit for Increasing Potential Difference Between Ground Voltage and Reference Voltage or Power Source Voltage of Oscillation Circuit
Method of Manufacturing Semiconductor Device and Semiconductor Device
Supply Voltage Generating Circuit
Semiconductor Memory Device and Control Method Thereof
Semiconductor Memory Integrated Circuit
Synchronous Semiconductor Memory Device
Method for Controlling a Semiconductor Apparatus
Semiconductor Apparatus
Device Identification-Code-Information Circuit and Semiconductor Integrated Circuit Having the Device Identification-Code-Information Circuit
Method of Manufacturing Semiconductor Device
Chip-Stacked Semiconductor Device and Manufacturing Method Thereof
Semiconductor Device Including Test Element Group and Method for Testing Therefor
Semiconductor Device and Method of Manufacturing the Same
Semiconductor Memory Device
Semiconductor Device and Method of Forming the Same
Semiconductor Memory Device
Antifuse Replacement Determination Circuit and Method of Semiconductor Memory Device
Semiconductor Apparatus and Production Method of the Same
Semiconductor Device
Fine Resist Pattern Forming Method and Nanoimprint Mold Structure
Address Counter, Semiconductor Memory Device Having the Same, and Data Processing System
Semiconductor Device and Manufacturing Method Thereof
Duty Detection Circuit, Dll Circuit Using the Same, Semiconductor Memory Circuit, and Data Processing System
Method of Manufacturing a Semiconductor Apparatus
Semiconductor Device
Semiconductor Memory Device
Pattern Forming Method and Mask
Semiconductor Device Including a First Land on the Wiring Substrate and a Second Land on the Sealing Portion
Output Control Signal Generating Circuit
Memory Device Including a Programmable Resistance Element
Phase Change Memory Device
Method for Designing Dummy Pattern, Exposure Mask, Semiconductor Device, Method for Manufacturing Semiconductor Device, and Storage Medium
Calibration Circuit, Semiconductor Device Including the Same, and Data Processing System
Latency Counter, Semiconductor Memory Device Including the Same, and Data Processing System
Calibration Circuit, Semiconductor Device Including the Same, and Memory Module
Phase Change Random Access Meomory and Semiconductor Device
Phase-Change Random Access Memory Device and Semiconductor Memory Device
Reference Voltage Generating Circuit
Method of Manufacturing a Semiconductor Device with Multilayer Sidewall
Memory System and Data Transmission Method
Semiconductor Device Having an Elevated Source/Drain Structure of Varying Cross-Section
Sense Amplifier for Semiconductor Memory Device
Semiconductor Device Having Improved Solder Joint and Internal Lead Lifetimes
Output Circuit for Semiconductor Device, Semiconductor Device Having Output Circuit, and Method of Adjusting Characteristics of Output Circuit
Semiconductor Device in Which a Memory Array Is Refreshed Based on an Address Signal
Memory Module and Memory System
Semiconductor Device and Manufacturing Method Thereof
Semiconductor Device, Memory Device and Memory Module Having Digital Interface
Semiconductor Memory Device
Semiconductor Memory Device
Memory Device Including a Programmable Resistance Element
Semiconductor Memory Device and Manufacturing Method Thereof
Semiconductor Memory Device and Method with Auxiliary I/O Line Assist Circuit and Functionality
Semiconductor Device and a Method of Manufacturing the Same
Boosting Charge Pump Circuit
Semiconductor Device
Method of Manufacturing a Semiconductor Device Including Recessed-Channel-Array Mosfet Having a Higher Operational Speed
Antifuse Replacement Determination Circuit and Method of Semiconductor Memory Device
Calibration Circuit, Semiconductor Device Including the Same, and Data Processing System
Output Circuit for a Semiconductor Memory Device and Data Output Method
System with Controller and Memory
Semiconductor Device Including Stacked Semiconductor Chips
Semiconductor Memory Device and Refresh Control Method
Stacked Semiconductor Device and Fabrication Method for Same
Output Circuit for Semiconductor Device, Semiconductor Device Having Output Circuit, and Method of Adjusting Characteristics of Output Circuit
Semiconductor Memory Device Having a Sense Amplifier Circuit with Decreased Offset
Semiconductor Chip Having Island Dispersion Structure and Method for Manufacturing the Same
Semiconductor Device and a Method of Manufacturing the Same
Semiconductor Memory Device and Manufacturing Method Thereof
Chip-Stacked Semiconductor Device and Manufacturing Method Thereof
Chip-stacked semiconductor and manufacturing method thereof
Calibration Circuit, Semiconductor Device Including the Same, and Data Processing System
Semiconductor Device Including Stacked Semiconductor Chips
Semiconductor Memory Device
System with Controller and Memory
Semiconductor Device Having a Trench-Gate Transistor
Method of Fabricating a Semiconductor Device
Semiconductor and a Method of Manufacturing the Same
Semiconductor Device Having a First Conductive Member Connecting a Chip to a Wiring Board Pad and a Second Conductive Member Connecting the Wiring Board Pad to a Land on an Insulator Covering the Chip and the Wiring Board
Semiconductor Storage Device
Semiconductor Device and a Method of Manufacturing the Same
Semiconductor Device and Manufacturing Method Therefor
Output Circuit for Semiconductor Device, Semiconductor Device Having Output Circuit, and Method of Adjusting Characteristics of Output Circuit
System with Controller and Memory
Memory Module and Memory System
Stacked Semiconductor Device and Fabrication Method for Same
Semiconductor Memory Device and Method with Auxiliary I/O Line Assist Circuit and Functionality
System with Controller and Memory
Semiconductor Device Including Stacked Semiconductor Chips
Semiconductor Device
Memory System and Data Transmission Method
Data Transfer Operation Completion Detection Circuit and Semiconductor Memory Device Provided Therewith
Supply Voltage Generating Circuit
Semiconductor Device and a Method of Manufacturing the Same
System with Controller and Memory
Semiconductor Memory Device and Method with Auxiliary I/O Line Assist Circuit and Functionality
Semiconductor Device and Manufacturing Method Therefor
Patent:
46,798 →
Application:
14/267,201 →
Data Transfer Operation Completion Detection Circuit and Semiconductor Memory Device Provided Therewith
Semiconductor Device Including Dummy Pattern
Memory Module and Memory System
Patent:
45,928 →
Application:
14/454,356 →
Memory Module and Memory System
Supply Voltage Generating Circuit
Semiconductor Device and a Method of Manufacturing the Same
Output Circuit for Semiconductor Device, Semiconductor Device Having Output Circuit, and Method of Adjusting Characteristics of Output Circuit
Semiconductor Device Including Stacked Semiconductor Chips
Output Circuit for Semiconductor Device, Semiconductor Device Having Output Circuit, and Method of Adjusting Characteristics of Output Circuit
Related Assignments
(12)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Feb 25, 2010
From: HITACHI, LTD.
To: ELPIDA MEMORY, INC.
Reel/Frame 023985/0775 →
Assignment of Assignor's Interest
Feb 25, 2010
From: HITACHI, LTD.
To: ELPIDA MEMORY, INC.
Reel/Frame 023985/0780 →
Security Agreement
May 15, 2012
From: ELPIDA MEMORY, INC.
To: APPLE INC.
Reel/Frame 028209/0477 →
Security Agreement
Jul 29, 2013
From: PS4 LUXCO S.A.R.L.
To: ELPIDA MEMORY INC.
Reel/Frame 032414/0261 →
Release of Security Interest
Feb 24, 2014
From: APPLE, INC
To: ELPIDA MEMORY, INC.
Reel/Frame 032331/0637 →
Assignment of Assignor's Interest
May 15, 2014
From: ELPIDA MEMORY, INC.
To: PS4 LUXCO S.A.R.L.
Reel/Frame 032900/0568 →
Assignment of Assignor's Interest
May 15, 2014
From: ELPIDA MEMORY, INC.
To: PS4 LUXCO S.A.R.L.
Reel/Frame 032894/0331 →
Assignment of Assignor's Interest
May 15, 2014
From: ELPIDA MEMORY, INC.
To: PS4 LUXCO S.A.R.L.
Reel/Frame 032899/0588 →
Assignment of Assignor's Interest
May 15, 2014
From: ELPIDA MEMORY, INC.
To: PS4 LUXCO S.A.R.L.
Reel/Frame 032894/0588 →
Assignment of Assignor's Interest
May 15, 2014
From: ELPIDA MEMORY, INC.
To: PS4 LUXCO S.A.R.L.
Reel/Frame 032898/0732 →
Change of Name
Aug 24, 2016
From: PS5 LUXCO S.A.R.L.
To: LONGITUDE SEMICONDUCTOR S.A.R.L.
Reel/Frame 039793/0880 →
Assignment of Assignor's Interest
Aug 24, 2016
From: PS4 LUXCO S.A.R.L.
To: PS5 LUXCO S.A.R.L.
Reel/Frame 039818/0506 →