IP Library Granted Patent US 7,911,058
Granted Patent B2
US 7,911,058 · App. 11/599,268 · Granted Mar 22, 2011

Semiconductor chip having island dispersion structure and method for manufacturing the same

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 7,911,058
App. No.
11/599,268
Granted
Mar 22, 2011
Kind
B2
Abstract

The present invention has an object to provide a semiconductor chip of high reliability with less risk of breakage. Specifically, the present invention provides a semiconductor chip having a semiconductor silicon substrate including a semiconductor device layer and a porous silicon domain layer, the semiconductor device layer being provided in a main surface region on one surface of the semiconductor silicon substrate, the porous silicon domain layer being provided in a main surface region on a back surface which is the other surface of the semiconductor silicon substrate, and the porous silicon domain layer having porous silicon domains dispersed like islands in the back surface of the semiconductor silicon substrate.

Claims (9)

1. A semiconductor chip including a semiconductor silicon substrate having a semiconductor device layer and a dimple layer,

said semiconductor device layer being provided in a main surface region on one surface of the semiconductor silicon substrate and including at least one transistor,

said dimple layer being provided in a main surface region on a back surface which is another surface of the semiconductor silicon substrate, and

said dimple layer having a plurality of dimples dispersed in the back surface of the semiconductor silicon substrate, and

said semiconductor chip further comprising a porous silicon layer on the back surface.

2. The semiconductor chip of claim 1 , wherein each of the dimples has substantially the same area as a circle having a diameter ranging from 0.2 to 800 μm.

3. The semiconductor chip of claim 1 , wherein a total area of the dimples ranges from 10% to 90% of an area of the back surface.

4. A semiconductor device including the semiconductor chip of claim 1 .

5. The semiconductor chip of claim 1 , wherein the porous silicon layer being formed over substantially entire area of the back surface.

Assignments (6)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 21, 2018
From: LONGITUDE SEMICONDUCTOR S.A.R.L.
To: LONGITUDE LICENSING LIMITED
Reel/Frame 046867/0248 →
CHANGE OF NAME Recorded Aug 24, 2016
From: PS5 LUXCO S.A.R.L.
To: LONGITUDE SEMICONDUCTOR S.A.R.L.
Reel/Frame 039793/0880 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 24, 2016
From: PS4 LUXCO S.A.R.L.
To: PS5 LUXCO S.A.R.L.
Reel/Frame 039818/0506 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 15, 2014
From: ELPIDA MEMORY, INC.
To: PS4 LUXCO S.A.R.L.
Reel/Frame 032900/0568 →
SECURITY AGREEMENT Recorded Jul 29, 2013
From: PS4 LUXCO S.A.R.L.
To: ELPIDA MEMORY INC.
Reel/Frame 032414/0261 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 14, 2009
From: HITACHI, LTD.
To: ELPIDA MEMORY INC.
Reel/Frame 023648/0212 →