Semiconductor integrated circuit device and method of testing the same
View Patent ↗A semiconductor integrated circuit device includes a control circuit configured to generate a control code to control a parameter of a predetermined circuit and outputs the control code to the predetermined circuit; and a latch circuit connected with an output of the control circuit to latch the control code in response to a control signal. The latch circuit may be provided between the control circuit and the predetermined circuit to latch the control code or transfer the control code to the predetermined circuit, in response to the control signal.
1. A semiconductor integrated circuit device comprising:
a control circuit configured to generate a control code to control a parameter of a predetermined circuit and outputs said control code to the predetermined circuit; and
a latch circuit connected with an output of said control circuit to latch said control code in response to a control signal.
2. The semiconductor integrated circuit device according to claim 1 , further comprising:
an external output circuit connected with said latch circuit to output said control code latched by said latch circuit to an external unit.
3. The semiconductor integrated circuit device according to claim 1 , further comprising:
a register circuit connected with said latch circuit, comprising at least one register and configured to store said control code.
4. The semiconductor integrated circuit device according to claim 1 , wherein said latch circuit is provided between said control circuit and said predetermined circuit to latch said control code or transfer said control code to said predetermined circuit, in response to said control signal.
5. The semiconductor integrated circuit device according to claim 1 , wherein said latch circuit is connected with said control circuit through a path different from a path through which said control circuit is connected with said predetermined circuit.
6. The semiconductor integrated circuit device according to claim 5 , further comprising:
an external output circuit connected with said latch circuit to output said control code latched by said latch circuit to an external unit.
7. The semiconductor integrated circuit device according to claim 5 , further comprising:
a register circuit connected with said latch circuit, comprising at least one register and configured to store said control code.
8. The semiconductor integrated circuit device according to claim 7 , further comprising:
an external output circuit connected with said register circuit to output said control code to an external unit.
9. The semiconductor integrated circuit device according to claim 7 , wherein said register circuit comprises a plurality of registers configured to store a plurality of said control codes in time series.
10. The semiconductor integrated circuit device according to claim 9 further comprising:
a selecting circuit configured to select one of said plurality of control codes and to output said selected control code to said predetermined circuit.
11. The semiconductor integrated circuit device according to claim 10 , further comprising:
an external output circuit connected with said register circuit to output said control code to an external unit.
12. The semiconductor integrated circuit device according to claim 1 , wherein said control circuit is an impedance control circuit configured to control an impedance of said predetermined circuit.
13. The semiconductor integrated circuit device according to claim 12 , wherein said predetermined circuit and said control circuit are provided in a DRAM.
14. A method of testing a semiconductor integrated circuit device which comprises a control circuit configured to a parameter of a predetermined circuit and a latch circuit, comprising:
(A) generating a control code to control the parameter of said predetermined circuit by said control circuit and outputting said control code to said predetermined circuit;
(B) latching said control code by said latch circuit in response to a control signal; and
(C) testing performance of said control circuit based on said control code.
15. A semiconductor integrated circuit device comprising:
a control circuit configured to receive a comparison result of a first signal and a second signal and generate a control code in response to the comparison result, the control code being supplied to a predetermined circuit to control a parameter of the predetermined circuit; and
a latch circuit connected with an output of said control circuit to latch said control code in response to a control signal.
16. The semiconductor integrated circuit device according to claim 15 , further comprising a comparison circuit that compares the first signal with the second signal to generate the comparison result and outputs the comparison result to the control circuit.
17. The semiconductor integrated circuit device according to claim 15 , wherein the first signal changes in response to the control code and the second signal is constant.
18. The semiconductor integrated circuit device according to claim 15 , further comprising:
a replica circuit that has the same characteristics as the predetermined circuit, the replica circuit outputting the first signal in response to the control code; and
a generator that generates the second signal that has a constant potential.