Patent Assignment
Reel/Frame 032898/0732
Assignment of Assignor's Interest
Recorded: 2014-05-15
Pages: 128
Assignor
ELPIDA MEMORY, INC.
Executed: 2013-07-26
Assignee
PS4 LUXCO S.A.R.L.
208, VAL DES BONS MALADES, LUXEMBOURG, L-2121, LUXEMBOURG
Covered Properties
(113)
Output Circuit Having Three Power Supply Lines
Patent:
5,436,487 →
Application:
08/248,729 →
Semiconductor Device Having a Boundary Scan Test Circuit
Patent:
5,477,493 →
Application:
08/317,606 →
Semiconductor Device Having High Speed Input Circuit
Patent:
5,537,058 →
Application:
08/493,305 →
Semiconductor Integrated Circuit Apparatus Having Input/Output Portions Impedance-Matched for Transmission Lines
Patent:
5,691,673 →
Application:
08/665,757 →
Semiconductor Memory Device with Switching Circuit for Controlling Internal Addresses in Parallel Test
Patent:
5,936,975 →
Application:
08/701,231 →
A Semiconductor Memory Device Test Circuit Having an Improved Compare Signal Generator Circuit
Patent:
5,777,932 →
Application:
08/736,402 →
Test Mode Power Circuit for Integrated-Circuits Chip
Patent:
5,841,271 →
Application:
08/906,824 →
Semiconductor Memory Device Having a Bit Compressed Test Mode and a Check Mode Selecting Section
Patent:
5,864,510 →
Application:
08/908,710 →
Semiconductor Integrated Circuit Device with Restoring Circuit
Patent:
6,035,430 →
Application:
08/954,098 →
Semiconductor Integrated Circuit Device Having Confirmable Self-Diagnostic Function
Patent:
5,953,273 →
Application:
09/085,059 →
Semiconductor Memory Device with Input/Output Masking Function Without Destruction of Data Bit
Patent:
6,002,624 →
Application:
09/098,376 →
Semiconductor Integrated Circuit Device with Built-in Test Circuit for Applying Stress to Timing Generator in Burn-in Test
Patent:
6,034,907 →
Application:
09/273,561 →
Semiconductor Synchronous Memory Device Responsive to External Masking Signal for Forcing Data Port to Enter into High-Impedance State and Method for Controlling the Same
Patent:
6,084,822 →
Application:
09/288,785 →
Roll Call Tester
Patent:
6,094,387 →
Application:
09/325,041 →
Method of Manufacturing a Semiconductor Device, and Semiconductor Device
Patent:
6,198,128 →
Application:
09/390,662 →
Synchronous Semiconductor Memory
Patent:
6,188,639 →
Application:
09/397,559 →
Data Memory
Patent:
6,507,917 →
Application:
09/444,553 →
Semiconductor Device and Testing Method of the Same
Patent:
6,519,726 →
Application:
09/461,200 →
Semiconductor Memory Device
Patent:
6,446,227 →
Application:
09/471,285 →
Semiconductor Memory Device for Making Column Decoder Operable According to Ras Access Time
Patent:
6,128,247 →
Application:
09/474,209 →
Semiconductor integrated circuit device equipped with power make-up circuit used in burn-in test after packaging and method for testing the same
Patent:
6,333,517 →
Application:
09/480,489 →
Method of Manufacturing Semiconductor Integrated Circuit Device Having Insulatro Film Formed from Liquid Containing Polymer of Silicon, Oxygen, and Hydrogen
Patent:
6,509,277 →
Application:
09/664,381 →
Semiconductor Integrated Circuit Device Having Spaced-Apart Electrodes and the Method Thereof
Patent:
6,756,262 →
Application:
09/708,450 →
Process for Multilayer Wiring Connections and Bonding Pad Adhesion to Dielectric in a Semiconductor Integrated Circuit Device
Synchronous Semiconductor Memory Device
Method for Testing Semiconductor Integrated Circuit Device Equipped with Power Make-Up Circuit Used in Burn-in Test
Method of Manufacturing Semiconductor Integrated Circuit Device Having Insulating Film Formed from Liquid Substance Containning Polymer of Silicon, Oxygen, and Hydrogen
Semiconductor Integrated Circuit with Test Mode
Semiconductor Memory Device and Method of Testing Semiconductor Memory Device
Semiconductor Device and Test Method Therefor
Semiconductor Memory Device and Test Method Thereof
Calibration Circuit
Semiconductor Device Including Output Buffer and Control Circuit Adjusting an Impedance of the Output Buffer
Semiconductor Device and Data Processing System
Manufacturing Method of Semiconductor Device
Semiconductor Memory Device and Method for Testing the Same
Semiconductor Device
Semiconductor Device Having Delay Control Circuit
Semiconductor Device, Internal Circuit Control Signal Measurement Circuit, and Delay Time Measurement Method
Semiconductor Device with Output Buffer Control Circuit for Sequentially Selecting Latched Data
Semiconductor Device
Method for Producing Low-K Film, Semiconductor Device, and Method for Manufacturing the Same
Method of Manufacturing a Semiconductor Device Including a Silicon Pillar
Semiconductor Device Having Cylindrical Lower Electrode of Capacitor and Manufacturing Method Thereof
Semiconductor Memory Device and Method of Testing the Same
Semiconductor Memory Device and Manufacturing Method Thereof
Semiconductor Device Including a Well Potential Supply Device and a Vertical Mos Transistor
Semiconductor Device and Method of Forming the Same
Semiconductor Device
Method for Manufacturing Semiconductor Device
Impedance Control Circuit and Semiconductor Device Including the Same
Semiconductor Device Having Output Driver
Method of Manufacturing Capacitive Insulating Film for Capacitor
Semiconductor Device and Semiconductor Device Manufacturing Method
Semiconductor Device
Device and Manufacturing Method Thereof
Method for Manufacturing Stacked Contact Plugs
Input Buffer Circuit
Semiconductor Device and Method for Manufacturing the Same
Semiconductor Device Having Plural Unit Buffers Constituting Output Buffer
Semiconductor Device, Relief-Address-Information Writing Device, and Relief-Address-Information Writing Method
Semiconductor Device and Information Processing System Including the Same
Semiconductor Memory Device, Method of Adjusting the Same and Information Processing System Including the Same
Semiconductor Device, System with Semiconductor Device, and Calibration Method
Semiconductor Device Including First Semiconductor Chip Including First Pads Connected to First Terminals, and Second Semiconductor Chip Including Second Pads Connected to Second Terminals
Semiconductor Device Having a Plurality of Memory Regions and Method of Testing the Same
Semiconductor Device, Method for Controlling the Same, and Data Processing System Including Semiconductor Device
Method for Manufacturing Mask
Semiconductor Device with Buffer and Replica Circuits
Semiconductor Memory Device and Method of Testing a Sense Amplifier of the Same
Semiconductor Device Having Three-Dimensional Transistor and Manufacturing Method Thereof
Method of Manufacturing Semiconductor Device
Memory Controller, Semiconductor Storage Device, and Memory System Including the Memory Controller and the Semiconductor Storage Device for Outputting Temperature Value in Low Power Consumption Mode
Method of Exposing a Semiconductor Wafer and Exposure Apparatus
A Semiconductor Device Including a Test Circuit That Generates Test Signals to Be Used for Adjustment on Operation of an Internal Circuit
Method of Manufacturing Semiconductor Device
Method for Manufacturing Semiconductor Device
Semiconductor Device
Semiconductor Device and Method of Adjusting Characteristic Thereof
Semiconductor Device Including a Phase-Change Memory Element
Semiconductor device and manufacturing method thereof
Semiconductor Device
Method for Producing Low-K Film, Semiconductor Device, and Method for Manufacturing the Same
Semiconductor Device
Method for Manufacturing Semiconductor Device
Semiconductor Device Having Bit Lines and Local I/O Lines
Method for Manufacturing Semiconductor Memory Device
Method of Manufacturing Semiconductor Device
Logic Circuit for a Semiconductor Memory Device, and Method of Managing an Operation in the Semiconductor Memory Device
Semiconductor Device
Method for Forming Semiconductor Device
Semiconductor Device Having Cylindrical Lower Electrode of Capacitor and Manufacturing Method Thereof
Semiconductor Device Including Phase Change Material and Method of Manufacturing Same
Method for Manufacturing Mask
Semiconductor Device Having Calibration Circuit for Adjusting Output Impedance of Output Buffer Circuit
Semiconductor Memory Device and Method of Testing the Same
Semiconductor Device
Semiconductor Device with Through Silicon via and Alignment Mark
Semiconductor Device and Method of Controlling the Same
Semiconductor Device and Method of Manufacturing the Same
Method for Manufacturing Semiconductor Device
Semiconductor Device Having Chip Crack Detection Structure
Method of Manufacturing a Semiconductor Device Having a Laminated Structure Comprising a Boron-Doped Silicon Germanium Film and a Metal Film
Method of Manufacturing Semiconductor Device
Semiconductor Device and Method of Adjusting an Impedance of an Output Buffer
Semiconductor Device
Manufacturing Method of Device
Method of Manufacturing Semiconductor Device
Semiconductor Device Generates Complementary Output Signals
Method for Manufacturing Semiconductor Device
Semiconductor Device and Method of Forming the Same
Semiconductor Device
Semiconductor Device and Information Processing System Including the Same
Related Assignments
(7)
Other recorded transfers of the patents in this record — the chain of ownership.
Security Agreement
May 15, 2012
From: ELPIDA MEMORY, INC.
To: APPLE INC.
Reel/Frame 028209/0477 →
Security Agreement
Jul 29, 2013
From: PS4 LUXCO S.A.R.L.
To: ELPIDA MEMORY INC.
Reel/Frame 032414/0261 →
Release of Security Interest
Feb 24, 2014
From: APPLE, INC
To: ELPIDA MEMORY, INC.
Reel/Frame 032331/0637 →
Change of Name
Aug 24, 2016
From: PS5 LUXCO S.A.R.L.
To: LONGITUDE SEMICONDUCTOR S.A.R.L.
Reel/Frame 039793/0880 →
Assignment of Assignor's Interest
Aug 24, 2016
From: PS4 LUXCO S.A.R.L.
To: PS5 LUXCO S.A.R.L.
Reel/Frame 039818/0506 →
Assignment of Assignor's Interest
Aug 21, 2018
From: LONGITUDE SEMICONDUCTOR S.A.R.L.
To: LONGITUDE LICENSING LIMITED
Reel/Frame 046867/0248 →
Assignment of Assignor's Interest
Aug 21, 2018
From: LONGITUDE SEMICONDUCTOR S.A.R.L.
To: LONGITUDE LICENSING LIMITED
Reel/Frame 046863/0001 →