Output circuit for semiconductor device, semiconductor device having output circuit, and method of adjusting characteristics of output circuit
View Patent ↗To decrease the circuit scale necessary for the calibration of the output circuit and to decrease the time required for the calibration operation. The invention includes a first output buffer and a second output buffer that are connected to a data pin, and a calibration circuit that is connected to a calibration pin. The first output buffer and the second output buffer include plural unit buffers. The unit buffers have mutually the same circuit structures. With this arrangement, the impedances of the first output buffer and the second output buffer can be set in common, based on the calibration operation using the calibration circuit. Consequently, both the circuit scale necessary for the calibration operation and the time required for the calibration operation can be decreased.
1. A method of controlling a device that includes first and second terminals and a plurality of unit buffers coupled in common to the first terminal, the second terminal being connected to a resistive element indicative of first impedance, the method comprising:
adjusting the unit buffers such that each of the unit buffers represents second impedance that is substantially equal to the first impedance;
activating first selected one or ones of the unit buffers when the device is in a first operation mode; and
activating second selected one or ones of the unit buffers when the device is in a second operation mode.
2. The method as claimed in claim 1 , wherein the first selected one or ones of the unit buffers are equal to the second selected one or ones of the unit buffers.
3. The method as claimed in claim 1 , wherein at least one or more buffers of the first selected one or ones of the unit buffers are different from the second selected one or ones of the unit buffers.
4. The method as claimed in claim 1 , wherein the first selected one or ones of the unit buffers are equal in number to the second selected one or ones of the unit buffers.
5. The method as claimed in claim 1 , wherein the first selected one or ones of the unit buffers are different in number from the second selected one or ones of the unit buffers.
6. The method as claimed in claim 1 , wherein the first operation mode is used to output a data signal at the terminal and the second operation mode is used for an ODT.
7. A method for a device that includes first and second terminals and a plurality of unit buffers coupled in common to the first terminal, the second terminal being connected to a resistive element, comprising;
adjusting the unit buffers such that each of the unit buffers being substantially equal in impedance to the resistive element;
selecting at least one buffer of the unit buffers in a first operation mode, impedance at the terminal being thereby based on, the at least one buffer; and
selecting one or more buffers of the unit buffers in a second operation mode, the impedance at the terminal being, thereby based on the one or more buffers.
8. The method as claimed in claim 7 , wherein the at least one buffer selected in the first operation mode is equal to at least one of the one or more buffers selected in the second operation mode.
9. The method as claimed in claim 7 , wherein, the at least one buffer is different from any one of the one or more buffers selected in the second operation mode.
10. The method as claimed in claim 7 , wherein at least two buffers of the unit buffers are selected in the first operation mode and one of the at least two buffers is different from any one of the at least one or more buffers selected in the second operation mode.
11. The method as claimed in claim 7 , wherein the first operation mode is used to output a data signal at the terminal and the second operation mode is used for an ODT.