Semiconductor memory device with delay section

1. A semiconductor memory device comprises:

a reference delay section having a first delay value and configured to delay a first signal by a reference delay value obtained from said first delay value and an adjustment value while changing said adjustment value, and to fix said adjustment value when said first signal and the delayed first signal meet a predetermined condition; and

a delay section having a second delay value, and configured to generate an output signal based on a summation of the fixed adjustment value and said second delay value, and a set multiplication value in response to a trigger signal such that said output signal in an active state for a period corresponding to said set multiplication value.

2. The semiconductor memory device according to claim 1 , wherein said predetermined condition is coincidence of a phase of said first signal and a phase of said delayed first signal.

3. The semiconductor memory device according to claim 1 , wherein said reference delay section comprises:

a control pulse signal generating circuit configured to generate a clock pulse signal when said first signal and the delayed first signal do not meet said predetermined condition; and

a counter circuit configured to count said clock pulse signal to change said adjustment value.

4. The semiconductor memory device according to claim 3 , wherein said control pulse signal generating circuit stops the generation of said clock pulse signal when said first signal and the delayed first signal meet said predetermined condition, and

said counter circuit holds and fixes said adjustment value when said clock pulse signal is not supplied from said control pulse signal generating circuit.

5. The semiconductor memory device according to claim 1 , wherein said second delay value is same as said first delay value.

6. The semiconductor memory device according to claim 1 , wherein said delay section comprises:

a control circuit configured to hold said output signal to said active state in response to said trigger signal, and to reset said output signal to an inactive state when the summation of the fixed adjustment value and said second delay value is equal to said set multiplication value.

7. The semiconductor memory device according to claim 6 , wherein said delay section comprises:

a delay circuit configured to delay said output signal by the summation of the fixed adjustment value and said second delay value;

a delay counter configured to count a number of times of the delay by said delay circuit; and

a coincidence detection circuit configured to generate a coincidence signal when detecting coincidence of a count value of said delay counter and said set multiplication value, and

said control circuit resets said output signal to the inactive state in response to said coincidence signal.

8. The semiconductor memory device according to claim 1 , further comprising:

a plurality of said delay sections,

wherein said reference delay section outputs the fixed adjustment value to said plurality of delay sections, and

said plurality of delay sections receives a plurality of said set multiplication values which are different from each other.

9. A method of generating an output signal with a desired delay in a semiconductor memory device, comprising:

delaying a first signal by a reference delay value obtained from a first delay value and an adjustment value while changing said adjustment value;

fixing said adjustment value when said first signal and the delayed first signal meet a predetermined condition; and

generating an output signal based on a summation of the fixed adjustment value and said second delay value, and a set multiplication value in response to a trigger signal such that said output signal in an active state for a period corresponding to said set multiplication value.

10. The method according to claim 9 , wherein said predetermined condition is coincidence of a phase of said first signal and a phase of said delayed first signal.

11. The method according to claim 9 , wherein said delaying a first signal comprises:

generating a clock pulse signal when said first signal and the delayed first signal do not meet said predetermined condition; and

counting said clock pulse signal to change said adjustment value.

12. The method according to claim 11 , wherein said fixing comprises:

stopping the generation of said clock pulse signal when said first signal and the delayed first signal meet said predetermined condition; and

holding and fixing said adjustment value when said clock pulse signal is not supplied from said control pulse signal generating circuit.

13. The method according to claim 9 , wherein said second delay value is same as said first delay value.

14. The method according to claim 9 , wherein said generating an output signal comprises:

holding said output signal to said active state in response to said trigger signal; and

resetting said output signal to an inactive state when the summation of the fixed adjustment value and said second delay value is equal to said set multiplication value.

15. The method according to claim 14 , wherein said generating an output signal further comprises:

delaying said output signal by the summation of the fixed adjustment value and said second delay value;

counting a number of times of the delay by said delay circuit; and

generating a coincidence signal when detecting coincidence of a count value of said delay counter and said set multiplication value, and

said resetting comprises:

resetting said output signal to the inactive state in response to said coincidence signal.

16. The method according to claim 9 , wherein said delaying and said fixing are carried out in a single reference delay section, and said generating an output signal is carried out in each of a plurality of delay sections, and

said plurality of delay sections receives a plurality of said set multiplication values which are different from each other.