Semiconductor device
View Patent ↗A semiconductor device capable of exchanging fuse data between registers is provided. Fuse circuits 20 to 24 are respectively connected to register circuits 10 to 14 , and output fuse data that is stored in the built-in fuses to the respective register circuits 10 to 14 . Register circuits 15 to 19 hold fuse data that is transferred from register circuits 10 to 14 , respectively. A logic circuit 30 is connected to the output of the register circuits 15 to 19 , and using the data held by the registers 15 to 19 , calculated information such as whether or not an externally input address matches a salvage address for salvaging defective bits. Register circuits 10 and 11, 11 and 12, . . . , 17 and 18, 18 and 19 are connected to each other, and fuse data is transferred between adjacent register circuits. When doing this, pairs of adjacent register circuits operate such that data transfer is performed according to self-timing handshake logic.
1. A semiconductor device comprising:
N number of fuse circuits having built-in fuses where N is a natural number;
1st to Nth register circuits that are respectively connected to said N number of fuse circuits, and that read the fuse data stored in said fuses;
Nth+1 to 2Nth register circuits that hold said fuse data that is respectively transferred from said 1st to Nth register circuits; and
a logic circuit that is connected to said Nth+1 to 2Nth register circuits, and that performs specified logic operations on said fuse data that is held by the register circuits; wherein
a Kth register circuit and a Kth+1 register circuit are connected, and said fuse data is transferred from said Kth register circuit to said Kth+1 register circuit according to self-timing handshake logic where K is a natural number from 1 to 2N−1.
2. The semiconductor device of claim 1 having a function whereby
said Kth register circuit sends a data-send-request signal to said Kth+1 register circuit, and when it receives a data-receive signal from said Kth+1 register circuit that corresponds to said data-send-request signal, it sends said fuse data that it holds to said Kth+1 register circuit, and further sends a data-send-end signal to said Kth+1 register circuit and receives a data-received signal from said Kth+1 register circuit that corresponds to said data-send-end signal.
3. The semiconductor device of claim 2 having a function whereby
when said Kth+1 register circuit receives said data-send-request signal from said Kth register circuit, it returns said data-receive signal to said Kth register circuit when conditions are such that said fuse data can be received, and when it receives said data-send-end signal, it receives said fuse data and holds it, then returns said data-received signal to said Kth register circuit.
4. The semiconductor of claim 1 wherein transfer of the fuse data held by said 1st register circuit to said Nth+1 register circuit is performed during a Delay Locked Loop DLL lock cycle after power-supply is started.
5. The semiconductor device of claim 1 comprising: said N number of fuse circuits, said 1st to 2Nth register circuits, and said logic circuit in a plurality of groups such that said fuse data is transferred according to said self-timing handshake logic for each respective group.
6. The semiconductor device of claim 1 wherein
said fuses store salvage-address information corresponding to defective bit or bits contained in memory; and
said logic circuit calculates the address information for salvaging said defective bit or bits for an externally input address based on said salvage-address information.
7. The semiconductor device of claim 5 wherein
said fuses store salvage-address information corresponding to defective bit or bits contained in memory; and
said logic circuit calculates the address information for salvaging said defective bit or bits for an externally input address based on said salvage-address information.