IP Library › Assignment 019414/0280
Patent Assignment
Reel/Frame 019414/0280

Assignment of Assignor's Interest

Recorded: 2007-06-12 Pages: 3
Assignor
SUN, MIN CHUL
Executed: 2007-04-26
Assignee
SAMSUNG ELECTRONICS CO., LTD.
416, MAETAN-DONG, YEONGTONG-GU, SUWON-SI, GYEONGGI-DO, KOREA, REPUBLIC OF
Covered Property (1)
Semiconductor Integrated Test Structures for Electron Beam Inspection of Semiconductor Wafers
Patent: 7,679,083 →
Application: 11/694,449 →
Publication: US 2008/0237586
Related Assignments (4)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Nov 28, 2007
From: JANSEN, SCOTT
To: INFINEON TECHNOLOGIES NORTH AMERICA CORP.
Reel/Frame 020168/0325 →
Assignment of Assignor's Interest Nov 28, 2007
From: MANN, RANDY; PATTERSON, OLIVER D.
To: INTERNATIONAL BUSINESS MACHINES CORPORATION
Reel/Frame 020168/0521 →
Assignment of Assignor's Interest Dec 21, 2007
From: JANSEN, SCOTT
To: INFINEON TECHNOLOGIES NORTH AMERICA CORP.
Reel/Frame 020281/0913 →
Assignment of Assignor's Interest Jan 16, 2008
From: INFINEON TECHNOLOGIES NORTH AMERICA CORP.
To: INFINEON TECHNOLOGIES AG
Reel/Frame 020372/0515 →