IP Library › Assignment 020168/0521
Patent Assignment
Reel/Frame 020168/0521

Assignment of Assignor's Interest

Recorded: 2007-11-28 Pages: 3
Assignors
MANN, RANDY
Executed: 2007-11-13
PATTERSON, OLIVER D.
Executed: 2007-11-13
Assignee
INTERNATIONAL BUSINESS MACHINES CORPORATION
NEW ORCHARD ROAD, ARMONK, NEW YORK, 10504
Covered Property (1)
Semiconductor Integrated Test Structures for Electron Beam Inspection of Semiconductor Wafers
Patent: 7,679,083 →
Application: 11/694,449 →
Publication: US 2008/0237586
Related Assignments (4)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Jun 12, 2007
From: SUN, MIN CHUL
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 019414/0280 →
Assignment of Assignor's Interest Nov 28, 2007
From: JANSEN, SCOTT
To: INFINEON TECHNOLOGIES NORTH AMERICA CORP.
Reel/Frame 020168/0325 →
Assignment of Assignor's Interest Dec 21, 2007
From: JANSEN, SCOTT
To: INFINEON TECHNOLOGIES NORTH AMERICA CORP.
Reel/Frame 020281/0913 →
Assignment of Assignor's Interest Jan 16, 2008
From: INFINEON TECHNOLOGIES NORTH AMERICA CORP.
To: INFINEON TECHNOLOGIES AG
Reel/Frame 020372/0515 →