IP Library Assignment 019522/0790
Patent Assignment
Reel/Frame 019522/0790

Assignment of Assignor's Interest

Recorded: 2007-07-06 Pages: 3
Assignors
KOESTER, LUDWIG
Executed: 2007-06-18
CZURRATIS, PETER
Executed: 2007-06-15
KRAEMER, KLAUS
Executed: 2007-06-21
Assignees
SAM TEC GMBH
GARTENSTR. 133, AALEN, 73430, GERMANY
SILTRONIC AG
HANNS-SEIDEL-PLATZ 4, MUNICH, 81737, GERMANY
Covered Property (1)
Method and Appartus for Detection of Mechanical Defects in an Ingot Piece Composed of Semiconductor Material
Patent: 8,038,895 →
Application: 11/764,854 →
Publication: US 2008/0041159
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Address Jun 30, 2021
From: SILTRONIC AG
To: SILTRONIC AG
Reel/Frame 056719/0881 →
Corrective Assignment to Correct the Date of the Change of Address from 03/12/2020 to 12/03/2020 Previously Recorded at Reel: 056719 Frame: 0881. Assignor(S) Hereby Confirms the Assignment. Jul 1, 2021
From: SILTRONIC AG
To: SILTRONIC AG
Reel/Frame 057561/0451 →