IP Library › Assignment 019544/0098
Patent Assignment
Reel/Frame 019544/0098

Assignment of Assignor's Interest

Recorded: 2007-07-11 Pages: 3
Assignors
IGARASHI, HISAO
Executed: 2006-09-06
SATO, KATSUMI
Executed: 2006-09-06
INOUE, KAZUO
Executed: 2006-09-06
Assignee
JSR CORPORATION
6-10, TSUKIJI 5-CHOME, CHUO-KU, TOKYO, 104-0045, JAPAN
Covered Property (1)
Probe Apparatus,Wafer Inspecting Apparatus Provided with the Probe Apparatus and Wafer Inspecting Method
Patent: 7,446,544 →
Application: 10/593,830 →
Publication: US 2007/0178727
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Jul 11, 2014
From: JSR CORPORATION
To: ISC CO., LTD.
Reel/Frame 033301/0837 →