Patent Assignment
Reel/Frame 019600/0729
Assignment of Assignor's Interest
Recorded: 2007-07-09
Pages: 3
Assignor
SEIKO INSTRUMENTS INC.
Executed: 2007-07-03
Assignee
SII NANOTECHNOLOGY INC.
8, NAKASE 1-CHOME, MIHAMU-KU, CHIBA-SHI, CHIBA, 261-8507, JAPAN
Covered Property
(1)
Method and Apparatus of Evaluating Layer Matching Deviation Based on Cad Information
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.