IP Library Assignment 019623/0761
Patent Assignment
Reel/Frame 019623/0761

Assignment of Assignor's Interest

Recorded: 2007-07-31 Pages: 7
Assignors
BAO, TIANMING
Executed: 2006-12-11
LIU, HAO-CHIH
Executed: 2006-12-04
DAHLEN, GREGORY A.
Executed: 2006-12-04
JAIN, ROHIT
Executed: 2006-12-08
Assignee
VEECO METROLOGY, INC.
112 ROBIN HILL ROAD, SANTA BARBARA, CALIFORNIA, 93117
Covered Property (1)
Systems and Methods for Utilizing Scanning Probe Shape Characterization
Patent: 7,578,176 →
Application: 11/645,092 →
Publication: US 2008/0154521
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Jun 11, 2012
From: VEECO METROLOGY INC.
To: BRUKER NANO, INC.
Reel/Frame 028350/0511 →