Patent Assignment
Reel/Frame 028350/0511
Change of Name
Recorded: 2012-06-11
Pages: 8
Assignor
VEECO METROLOGY INC.
Executed: 2010-10-07
Assignee
BRUKER NANO, INC.
112 ROBIN HILL ROAD, SANTA BARBARA, CALIFORNIA, 93117
Covered Properties
(56)
Interferometric Integration Technique and Apparatus to Confine 2PI Discontinuity
Patent:
5,321,497 →
Application:
07/848,309 →
Rough Surface Profiler and Method
Patent:
5,204,734 →
Application:
07/880,083 →
Scanning Probe Microscope Including Height Plus Deflection Method and Apparatus to Achieve Both High Resolution and High Speed Scanning
Patent:
5,260,572 →
Application:
07/929,676 →
Positioning Device for Scanning Probe Microscopes
Patent:
5,306,919 →
Application:
07/947,831 →
Atomic Force Microscope Having Cantilever with Piezoresistive Deflection Sensor
Patent:
5,345,815 →
Application:
07/954,695 →
An Improved Scanning Probe Microscope Using Stored Data for Vertical Probe Positioning
Patent:
5,308,974 →
Application:
07/982,871 →
Method for Testing an Optical Window with a Small Wedge Angle
Patent:
5,398,112 →
Application:
08/131,486 →
Rough Surface Profiler and Method
Patent:
5,355,221 →
Application:
08/143,372 →
Scanning Probe Microscope Using Stored Data for Vertical Probe Positioning
Patent:
5,418,363 →
Application:
08/202,287 →
Multimode-Laser Interferometric Apparatus for Eliminating Background Interference Fringes from Thin-Plate Measurements
Patent:
5,452,088 →
Application:
08/210,671 →
Combination of Motorized and Piezoelectric Translation for Long-Range Vertical Scanning Interferometry
Patent:
5,446,547 →
Application:
08/235,105 →
Atomic Force Microscope Having Cantilever with Piezoresistive Deflection Sensor
Patent:
5,483,822 →
Application:
08/238,546 →
Combination of White-Light Scanning and Phase-Shifting Interferometry for Surface Profile Measurements
Patent:
5,471,303 →
Application:
08/247,065 →
Scanning Force Microscope Having Aligning and Adjusting Means
Patent:
35,514 →
Application:
08/325,997 →
Method and Apparatus for Restoring Digitized Video Pictures Generated by an Optical Surface-Height Profiler
Patent:
5,717,782 →
Application:
08/339,405 →
Suspension Assembly Static Attitude and Distance Measuring Instrument
Patent:
5,636,013 →
Application:
08/368,547 →
Method and Apparatus for Absolute Optical Measurement of Entire Surfaces of Flats
Patent:
5,502,566 →
Application:
08/387,635 →
Method of Fabricating Cantilever for Atomic Force Microscope Having Piezoresistive Deflection Detector
Patent:
5,595,942 →
Application:
08/417,485 →
Centroid Approach for Estimating Modulation Peak in Broad-Bandwidth Interferometry
Patent:
5,633,715 →
Application:
08/446,019 →
Large Stage System for Scanning Probe Microscopes and Other Instruments
Patent:
5,672,816 →
Application:
08/448,004 →
Method for Measuring Thin-Film Thickness and Step Height on the Surface of Thin-Film/Substrate Test Samples by Phase-Shifting Interferometry
Patent:
5,555,471 →
Application:
08/449,353 →
High Resolution Fiber Optic Probe for Near Field Optical Microscopy and Method of Making Same
Patent:
5,664,036 →
Application:
08/542,437 →
Method and Apparatus for Correcting Surface Profiles Determined by Phase-Shifting Interferometry According to Optical Parameters of Test Surface
Patent:
5,602,643 →
Application:
08/597,796 →
All-Fiber, High-Sensitivity, Near-Field Optical Microscopy Instrument Employing Guided Wave Light Collector and Specimen Support
Patent:
5,796,909 →
Application:
08/601,600 →
Orthogonal-Scanning Microscope Objective for Vertical-Scanning and Phase-Shifting Interferometry
Patent:
5,640,270 →
Application:
08/613,462 →
Variable-Speed Scanning for Interferometric Measurements
Patent:
5,726,754 →
Application:
08/697,865 →
Scanning Probe Microscope Having a Single Viewing Device for on-Axis and Oblique Angle Views
Patent:
5,714,756 →
Application:
08/710,239 →
Method of Combining Multiple Sets of Overlapping Surface-Profile Interferometric Data to Produce a Continuous Composite Map
Patent:
5,987,189 →
Application:
08/771,428 →
Atomic Force Microscope for Measuring Properties of Dielectric and Insulating Layers
Patent:
5,874,734 →
Application:
08/777,655 →
Method and Apparatus for Correcting Shifts Between a Reference Focal Point and a Reference Surface as a Result of Thermal Effects in an Interferometric Optical Objective
Patent:
5,978,086 →
Application:
08/814,351 →
Interchangeable Sample Stage with Integral Reference Surface for Magnetic-Head Suspension Measuring Instrument
Patent:
5,844,675 →
Application:
08/866,747 →
Autocollimator with Grating
Patent:
5,995,215 →
Application:
08/889,675 →
Scan Control for Scanning Probe Microscopes
Patent:
37,560 →
Application:
08/948,909 →
Feedback Control for Scanning Tunnel Microscopes
Patent:
37,203 →
Application:
09/034,175 →
Tapping Atomic Force Microscope with Phase or Frequency Detection
Patent:
36,488 →
Application:
09/082,320 →
Scanning Stylus Atomic Force Microscope with Cantilever Tracking and Optical Access
Patent:
6,032,518 →
Application:
09/119,549 →
Method and Apparatus for Dna Sequencing Using a Local Sensitive Force Detector
Patent:
6,280,939 →
Application:
09/145,352 →
Method of Combining Multiple Sets of Overlapping Surface-Profile Interferometric Data to Produce a Continuous Composite Map
Patent:
6,185,315 →
Application:
09/153,365 →
Method and Apparatus for a Line Based, Two-Dimensional Characterization of a Three-Dimensional Surface
Patent:
6,427,345 →
Application:
09/189,443 →
Wheelchair Having a Single Tube Bend
Patent:
6,189,906 →
Application:
09/258,404 →
High Precision Optical Metrology Using Frequency Domain Interpolation
Patent:
6,314,212 →
Application:
09/260,599 →
Method and Apparatus for Atomic Force Microscopy
Patent:
6,642,517 →
Application:
09/491,000 →
Balanced Momentum Probe Holder
Balanced Momentum Probe Holder
System for Wide Frequency Dynamic Nanomechanical Analysis
Flexure Assembly for a Scanner
Methods of Fabricating Structures for Characterizing Tip Shape of Scanning Probe Microscope Probes and Structures Fabricated Thereby
Probes for Use in Scanning Probe Microscopes and Methods of Fabricating Such Probes
Balanced Momentum Probe Holder
Flexure Assembly for a Scanner
Capacitance Probe for Thin Dielectric Film Characterization
System for Wide Frequency Dynamic Nanomechanical Analysis
Methods of Fabricating Structures for Characterizing Tip Shape of Scanning Probe Microscope Probes and Structures Fabricated Thereby
Cantilever Free-Decay Measurement System with Coherent Averaging
Systems and Methods for Utilizing Scanning Probe Shape Characterization
High-Bandwidth Actuator Drive for Scanning Probe Microscopy
Related Assignments
(12)
Other recorded transfers of the patents in this record — the chain of ownership.
Change of Name
Jul 13, 2010
From: THERMOMICROSCOPES CORP.
To: TM MICROSCOPES CORP.
Reel/Frame 024672/0330 →
Change of Name
Jul 13, 2010
From: PARK SCIENTIC INSTRUMENTS CORPORATION
To: THERMOMICROSCOPES CORP.
Reel/Frame 024672/0335 →
Merger
Jul 13, 2010
From: TM MICROSCOPES CORP.
To: VEECO METROLOGY, LLC
Reel/Frame 024672/0340 →
Merger
Jul 13, 2010
From: VEECO METROLOGY, LLC
To: VEECO METROLOGY INC.
Reel/Frame 024672/0350 →
Release of Security Interest
Jul 15, 2010
From: SILICON VALLEY BANK
To: VEECO INSTRUMENTS INC.
Reel/Frame 024686/0135 →
Change of Name
Sep 2, 2010
From: PARK SCIENTIFIC INSTRUMENTS CORPORATION
To: THERMOMICROSCOPES CORP.
Reel/Frame 024933/0059 →
Change of Name
Sep 3, 2010
From: THERMOMICROSCOPES CORP.
To: TM MICROSCOPES CORP.
Reel/Frame 024933/0710 →
Merger
Sep 7, 2010
From: TM MICROSCOPES CORP.
To: VEECO METROLOGY, LLC
Reel/Frame 024933/0984 →
Change of Name
Sep 7, 2010
From: WYKO CORPORATION
To: VEECO TUCSON INC.
Reel/Frame 024946/0669 →
Merger
Sep 8, 2010
From: VEECO METROLOGY, LLC
To: VEECO METROLOGY INC.
Reel/Frame 024953/0435 →
Change of Name
Sep 9, 2010
From: VEECO TUCSON INC.
To: VEECO METROLOGY INC.
Reel/Frame 024953/0612 →
Assignment of Assignor's Interest
Sep 28, 2010
From: VEECO INSTRUMENTS INC.
To: VEECO METROLOGY INC.
Reel/Frame 025051/0290 →