Patent Assignment
Reel/Frame 024672/0340
Merger
Recorded: 2010-07-13
Pages: 10
Assignor
TM MICROSCOPES CORP.
Executed: 2003-12-19
Assignee
VEECO METROLOGY, LLC
112 ROBIN HILL RD., SANTA BARBARA, CALIFORNIA, 93117
Covered Properties
(17)
Scanning Probe Microscope
Patent:
5,376,790 →
Application:
07/850,669 →
Optical System for Scanning Microscope
Patent:
5,448,399 →
Application:
07/850,677 →
Piezpresistive Cantilever for Scanning Probe Microscope
Patent:
5,444,244 →
Application:
08/073,201 →
Scanning Probe Microscope
Patent:
5,496,999 →
Application:
08/320,490 →
Scanning Force Microscope Having Aligning and Adjusting Means
Patent:
35,514 →
Application:
08/325,997 →
Large Stage System for Scanning Probe Microscopes and Other Instruments
Patent:
5,672,816 →
Application:
08/448,004 →
Single Axis Vibration Reducing System
Patent:
5,811,821 →
Application:
08/694,690 →
Scanning Probe Microscope Providing Unobstructed Top Down and Bottom Up Views
Patent:
5,854,487 →
Application:
08/808,351 →
Scanning Probe Microscope with Multimode Head
Patent:
6,130,427 →
Application:
08/828,771 →
Scanning Probe Microscope with Scan Correction
Patent:
5,939,719 →
Application:
08/831,153 →
Atomic Force Microscope for Attachment to Optical Microscope
Patent:
5,861,624 →
Application:
08/916,571 →
Atomic Force Microscope with Integrated Optics for Attachment to Optical Microscope
Patent:
5,952,657 →
Application:
08/916,830 →
Voice Coil Scanner for Use in Scanning Probe Microscope
Patent:
6,005,251 →
Application:
09/119,808 →
Kinematically Mounted Probe Holder for Scanning Probe Microscope
Patent:
6,057,546 →
Application:
09/129,066 →
Scanning Probe Microscope with Scan Correction
Patent:
6,057,547 →
Application:
09/208,733 →
Scanning probe microscope with scan correction
Patent:
6,265,718 →
Application:
09/561,448 →
Optical System for Scanning Microscope
Related Assignments
(10)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Oct 21, 1996
From: ALEXANDER, JOHN D.; KIRK, MICHAEL D.
To: PARK SCIENTIFIC INSTRUMENTS
Reel/Frame 008187/0729 →
Assignment of Assignor's Interest
Jul 16, 2001
From: PARK, SANG-II
To: THERMOMICROSCOPES, CORP.
Reel/Frame 012034/0920 →
Assignment of Assignor's Interest
Jul 16, 2001
From: SMITH, IAN R.
To: THERMOMICROSCOPES, CORP.
Reel/Frame 012034/0814 →
Assignment of Assignor's Interest
Sep 6, 2001
From: PARK, SANG-II; LINKER, FREDERICK I.; SMITH, IAN R.
To: THERMOMICROSCOPES CORPORATION
Reel/Frame 012164/0103 →
Change of Name
Jul 13, 2010
From: PARK SCIENTIC INSTRUMENTS CORPORATION
To: THERMOMICROSCOPES CORP.
Reel/Frame 024672/0335 →
Change of Name
Jul 13, 2010
From: THERMOMICROSCOPES CORP.
To: TM MICROSCOPES CORP.
Reel/Frame 024672/0330 →
Merger
Jul 13, 2010
From: VEECO METROLOGY, LLC
To: VEECO METROLOGY INC.
Reel/Frame 024672/0350 →
Release of Security Interest
Jul 15, 2010
From: SILICON VALLEY BANK
To: VEECO INSTRUMENTS INC.
Reel/Frame 024686/0135 →
Change of Name
Oct 24, 2011
From: VEECO METROLOGY INC.
To: BRUKER NANO, INC.
Reel/Frame 027111/0461 →
Change of Name
Jun 11, 2012
From: VEECO METROLOGY INC.
To: BRUKER NANO, INC.
Reel/Frame 028350/0511 →