Patent Assignment
Reel/Frame 027111/0461
Change of Name
Recorded: 2011-10-24
Pages: 10
Assignor
VEECO METROLOGY INC.
Executed: 2010-10-07
Assignee
BRUKER NANO, INC.
112 ROBIN HILL ROAD, SANTA BARBARA, CALIFORNIA, 93117
Covered Properties
(119)
Feedback Control for Scanning Tunnel Microscopes
Patent:
34,331 →
Application:
07/761,171 →
Scanner for Scanning Probe Microscopes Having Reduced Z-Axis Non-Linearity
Patent:
5,198,715 →
Application:
07/793,245 →
Atomic Force Microscope
Patent:
5,224,376 →
Application:
07/831,876 →
Method of Adjusting the Size of the Area Scanned by a Scanning Probe
Patent:
5,204,531 →
Application:
07/835,577 →
Scanning Probe Microscope
Patent:
5,376,790 →
Application:
07/850,669 →
Optical System for Scanning Microscope
Patent:
5,448,399 →
Application:
07/850,677 →
Atomic Force Microscope for Small Samples Having Dual-Mode Operating Capability
Patent:
5,253,516 →
Application:
07/883,043 →
A Tapping Atomic Force Microscope
Patent:
5,412,980 →
Application:
07/926,175 →
Stiffness Enhancer for Movable Stage Assembly
Patent:
5,314,254 →
Application:
07/970,875 →
Methods of Operating Atomic Force Microscopes to Measure Friction
Patent:
5,400,647 →
Application:
07/974,603 →
Jumping Probe Microscope
Patent:
5,266,801 →
Application:
08/009,076 →
Resonance Contact Scanning Force Microscope
Patent:
5,481,908 →
Application:
08/055,236 →
Piezpresistive Cantilever for Scanning Probe Microscope
Patent:
5,444,244 →
Application:
08/073,201 →
Atomic Force Microscope
Patent:
5,329,808 →
Application:
08/085,053 →
Synchronous Sampling Scanning Force Microscope
Patent:
5,406,832 →
Application:
08/086,592 →
Scanning Stylus Atomic Force Microscope with Cantilever Tracking and Optical Access
Patent:
5,463,897 →
Application:
08/107,017 →
Thermal Sensing Scanning Probe Microscope and Method for Measurement of Thermal Parameters of a Specimen
Patent:
5,441,343 →
Application:
08/127,661 →
Jumping Probe Microscope
Patent:
5,415,027 →
Application:
08/147,571 →
Scanning Probe Microscope Apparatus for Use in a Scanning Electron Microscope
Patent:
5,455,420 →
Application:
08/273,740 →
Scanning Apparatus Linearization and Calibration System
Patent:
5,469,734 →
Application:
08/357,133 →
Synchronous Sampling Scanning Force Microscope
Patent:
5,507,179 →
Application:
08/360,588 →
Tapping Atomic Force Microscope with Phase or Frequency Detection
Patent:
5,519,212 →
Application:
08/381,159 →
Scanning Stylus Atomic Force Microscope with Cantilever Tracking and Optical Access
Patent:
5,560,244 →
Application:
08/416,100 →
Scanning Probe Microscope Having a Single Viewing Device for on-Axis and Oblique Optical Views
Patent:
5,877,891 →
Application:
08/428,358 →
Scanning Probe Microscope Apparatus for Use in a Scanning Electron Microscope
Patent:
5,510,615 →
Application:
08/478,479 →
Methods of Operating Atomic Force Microscopes to Measure Friction
Patent:
5,553,487 →
Application:
08/502,368 →
Scanning Probe Microscope Having Automatic Probe Exchange and Alignment
Patent:
5,705,814 →
Application:
08/521,584 →
Scanning Apparatus Linearization and Calibration System
Patent:
5,641,897 →
Application:
08/560,827 →
Resonance Contact Scanning Force Microscope
Patent:
5,681,987 →
Application:
08/631,555 →
Scanning Stylus Atomic Force Microscope with Cantilever Tracking and Optical Access
Patent:
5,714,682 →
Application:
08/679,332 →
Single Axis Vibration Reducing System
Patent:
5,811,821 →
Application:
08/694,690 →
Method and Apparatus for Measuring Mechanical Properties on a Small Scale
Patent:
5,866,807 →
Application:
08/794,379 →
Scanning Probe Microscope Providing Unobstructed Top Down and Bottom Up Views
Patent:
5,854,487 →
Application:
08/808,351 →
Scanning Probe Microscope with Multimode Head
Patent:
6,130,427 →
Application:
08/828,771 →
Scanning Probe Microscope with Scan Correction
Patent:
5,939,719 →
Application:
08/831,153 →
Method and Apparatus for Measuring Energy Dissipation by a Probe During Operation of an Atomic Force Microscope
Patent:
6,038,916 →
Application:
08/898,469 →
Atomic Force Microscope for Attachment to Optical Microscope
Patent:
5,861,624 →
Application:
08/916,571 →
Atomic Force Microscope with Integrated Optics for Attachment to Optical Microscope
Patent:
5,952,657 →
Application:
08/916,830 →
Method and Apparatus for Obtaining Improved Vertical Metrology Measurements
Patent:
5,898,106 →
Application:
08/937,494 →
Method for Improving the Operation of Oscillating Mode Atomic Force Microscopes
Patent:
6,008,489 →
Application:
08/984,058 →
Voice Coil Scanner for Use in Scanning Probe Microscope
Patent:
6,005,251 →
Application:
09/119,808 →
Kinematically Mounted Probe Holder for Scanning Probe Microscope
Patent:
6,057,546 →
Application:
09/129,066 →
Afm with Referenced or Differential Height Measurement
Patent:
6,196,061 →
Application:
09/186,742 →
Method and Apparatus for the Quantitative and Objective Correlation of Data from a Local Sensitive Force Detector
Patent:
6,357,285 →
Application:
09/188,497 →
Scanning Probe Microscope with Scan Correction
Patent:
6,057,547 →
Application:
09/208,733 →
Method and Apparatus for Cleaning a Tip of a Probe of a Probe-Based Measuring Instrument
Patent:
6,353,221 →
Application:
09/240,713 →
Vertical Probe Card for Attachment Within a Central Corridor of a Magnetic Field Generator
Patent:
6,359,453 →
Application:
09/255,477 →
Active Probe for an Atomic Force Microscope and Method of Use Thereof
Patent:
6,189,374 →
Application:
09/280,160 →
Method and System for Increasing the Accuracy of a Probe-Based Instrument Measuring a Heated Sample
Patent:
6,185,992 →
Application:
09/354,448 →
Flexure Assembly for a Scanner
Patent:
6,246,052 →
Application:
09/398,698 →
High Bandwidth Recoiless Microactuator
Patent:
6,323,483 →
Application:
09/399,388 →
Active Probe for an Atomic Force Microscope and Method of Use Thereof
Patent:
6,530,266 →
Application:
09/476,163 →
Scanning probe microscope with scan correction
Patent:
6,265,718 →
Application:
09/561,448 →
AFM with referenced or differential height measurement
Patent:
6,279,389 →
Application:
09/698,919 →
Method and System for Increasing the Accuracy of a Probe-Based Instrument Measuring a Heated Sample
Method and apparatus for high resolution profiling in semiconductor structures
Patent:
6,287,880 →
Application:
09/751,728 →
Method and Apparatus for Reducing the Parachuting of a Probe
Apparatus and Method for Isolating and Measuring Movement in Metrology Apparatus
Flexure Assembly for a Scanner
Apparatus and Method for Isolating and Measuring Movement in a Metrology Apparatus
Method of Characterizing a Semiconductor Surface
Method and Apparatus for Manipulating a Sample
Dynamic Activation for an Atomic Force Microscope and Method of Use Thereof
Optical System for Scanning Microscope
Force Scanning Probe Microscope
Manual Control with Force-Feedback for Probe Microscopy-Based Force Spectroscopy
Patent:
7,013,717 →
Application:
10/006,090 →
Apparatus and Method to Compensate for Stress in a Microcantilever
Patent:
6,941,823 →
Application:
10/045,438 →
Scanning Electrochemical Potential Microscope
Patent:
7,156,965 →
Application:
10/052,921 →
Vertical Probe Card for Attachment Within a Central Corridor of a Magnetic Field Generator
Image Reconstruction Method
Patent:
6,810,354 →
Application:
10/139,949 →
Flexure Assembly for a Scanner
Torsional Resonance Mode Probe-Based Instrument and Method
Patent:
6,945,099 →
Application:
10/189,108 →
Environmental Scanning Probe Microscope
Active Probe for an Atomic Force Microscope and Method of Use Thereof
Method of Fabricating a Surface Probing Device and Probing Device Produced Thereby
Apparatus and Method for Improving Tuning of a Probe-Based Instrument
Scanning Thermal Probe Microscope
Patent:
7,448,798 →
Application:
10/464,379 →
Apparatus and Method for Isolating and Measuring Movement in a Metrology Apparatus
Dynamic Activation for an Atomic Force Microscope and Method of Use Thereof
Force Scanning Probe Microscope
Method and Apparatus of Driving Torsional Resonance Mode of a Probe-Based Instrument
Image Reconstruction Method
Active Probe for an Atomic Force Microscope and Method for Use Thereof
Method and Apparatus for Manipulating a Sample
Method and Apparatus for Obtaining Quantitative Measurements Using a Probe Based Instrument
Method of Fabricating a Surface Probing Device
Method and Apparatus for Rapid Automatic Engagement of a Probe
Method and Apparatus for Measuring Electrical Properties in Torsional Resonance Mode
Tracking Qualification and Self-Optimizing Probe Microscope and Method
Method and Apparatus for Measuring a Characteristic of a Sample Feature
Scanning Probe Microscopy Method and Apparatus Utilizing Sample Pitch
Method and Apparatus for Reducing Lateral Interactive Forces During Operation of a Probe-Based Instrument
Method and Apparatus of Manipulating a Sample
Method of Making a Force Curve Measurement on a Sample
Optical Detection Alignment/Tracking Method and Apparatus
Dynamic Activation for an Atomic Force Microscope and Method of Use Thereof
Method and Apparatus for Monitoring Movement of a Spm Actuator
Apparatus and Method of Amplifying Low Voltage Signals
Thermal Mechanical Drive Actuator, Thermal Probe and Method of Thermally Driving a Probe
Method and Apparatus of High Speed Property Mapping
Method and Apparatus of Scanning a Sample Using a Scanning Probe Microscope
Image Reconstruction Method
Method and Apparatus for Obtaining Material Property Information of a Heterogeneous Sample Using Harmonic Resonance Imaging
Method and Apparatus for Measuring Electrical Properties in Torsional Resonance Mode
Method and Apparatus of Driving Torsional Resonance Mode of a Probe-Based Instrument
Fast-Scanning Spm Scanner and Method of Operating Same
Closed Loop Controller and Method for Fast Scanning Probe Microscopy
Fast-Scanning Spm and Method of Operating Same
Probe Device for a Metrology Instrument and Method of Fabricating the Same
Apparatus and Method of Transporting and Loading Probe Devices of a Metrology Instrument
Non-Destructive Wafer-Scale Sub-Surface Ultrasonic Microscopy Employing Near Field Afm Detection
Probe for a Scanning Probe Microscope and Method of Manufacture
Method and Apparatus of Automatic Scanning Probe Imaging
Polarization Mirau Interference Microscope
Patent:
8,072,610 →
Application:
12/217,015 →
Method of Fabricating a Probe Device for a Metrology Instrument and a Probe Device Produced Thereby
Method and Apparatus for Obtaining Quantitative Measurements Using a Probe Based Instrument
Probe Microscope Setup Method
Method and Apparatus of Operating a Scanning Probe Microscope
Method and Apparatus of Operating a Scanning Probe Microscope
Related Assignments
(12)
Other recorded transfers of the patents in this record — the chain of ownership.
Merger
Jul 13, 2010
From: VEECO METROLOGY, LLC
To: VEECO METROLOGY INC.
Reel/Frame 024672/0350 →
Change of Name
Jul 13, 2010
From: THERMOMICROSCOPES CORP.
To: TM MICROSCOPES CORP.
Reel/Frame 024672/0330 →
Change of Name
Jul 13, 2010
From: PARK SCIENTIC INSTRUMENTS CORPORATION
To: THERMOMICROSCOPES CORP.
Reel/Frame 024672/0335 →
Merger
Jul 13, 2010
From: TM MICROSCOPES CORP.
To: VEECO METROLOGY, LLC
Reel/Frame 024672/0340 →
Release of Security Interest
Jul 15, 2010
From: SILICON VALLEY BANK
To: VEECO INSTRUMENTS INC.
Reel/Frame 024686/0135 →
Merger
Sep 1, 2010
From: DIGITAL INSTRUMENTS, INC.
To: VEECO INSTRUMENTS INC.
Reel/Frame 024944/0020 →
Merger
Sep 8, 2010
From: VEECO METROLOGY, LLC
To: VEECO METROLOGY INC.
Reel/Frame 024953/0435 →
Assignment of Assignor's Interest
Sep 28, 2010
From: VEECO INSTRUMENTS INC.
To: VEECO METROLOGY INC.
Reel/Frame 025051/0290 →
Assignment of Assignor's Interest
Oct 1, 2010
From: VEECO INSTRUMENTS INC.
To: VEECO METROLOGY INC.
Reel/Frame 025077/0630 →
Merger
Oct 1, 2010
From: DIGITAL INSTRUMENTS, INC.
To: VEECO INSTRUMENTS, INC.
Reel/Frame 025077/0554 →
Assignment of Assignor's Interest
Oct 12, 2021
From: VAN SAMBEEK, ELLEN
To: DUMMEN GROUP B.V.
Reel/Frame 057763/0828 →
Intellectual Property Security Agreement
Aug 14, 2024
From: DÜMMEN GROUP B.V.; DÜMMEN ORANGE JUNGPFLANZEN GMBH & CO. KG; DÜMMEN NA, INC.
To: KROLL TRUSTEE SERVICES LIMITED, AS SECURITY AGENT
Reel/Frame 068790/0081 →