Probe device for a metrology instrument and method of fabricating the same
View Patent ↗A method of producing a probe device for a metrology instrument such as an AFM includes providing a substrate having front and back surfaces and then forming an array of tip height structures on the first surface of the substrate, the structures having varying depths corresponding to selectable tip heights. The back surface of the substrate is etched until a thickness of the substrate substantially corresponds to a selected tip height, preferably by monitoring this etch visually and/or monitoring the etch rate. The tips are patterned from the front side of the wafer relative to fixed ends of the cantilevers, and then etched using an anisotropic etch. As a result, probe devices having sharp tips and short cantilevers exhibit fundamental resonant frequencies greater than 700 kHz or more.
1. A method for fabricating a probe for a probe microscope comprising the steps of:
providing a bulk single crystal silicon wafer;
etching a region of the silicon wafer to a desired thickness;
depositing silicon nitride on the backside of the etched silicon region;
patterning and etching a tip from the etched silicon region;
patterning and etching a cantilever from the silicon nitride; and
wherein the cantilever has a length of less than about 50 μm and wherein the tip is positioned within about 5 μm of the free end of the cantilever and the effective radius of the tip is less than about 20 nm.
2. The method of claim 1 , wherein the tip has a height of less than about 4 μm.
3. The method of claim 2 , wherein a tip height monitor feature is formed to control the etching step.
4. The method of claim 2 , wherein the tip height is controlled by monitoring a backside etch of the wafer.
5. The method of claim 4 , wherein the monitoring step includes at least one of a) monitoring an etch rate associated with the backside etch, and b) visually inspecting the wafer during the backside etch.
6. The method of claim 2 , wherein, during fabrication, the tip is positioned by measuring a distance between a tip pattern and the fixed end.
7. The method of claim 2 , wherein the probe device is one of an array of probe devices fabricated from the substrate and the yield is greater than about 90%.
8. The method of claim 1 , wherein the silicon nitride is supported by a thin film.
9. The method of claim 8 , wherein the thin film is an oxide.
10. The method of claim 8 , wherein the thickness of the silicon nitride is less than about 2 microns with a tolerance of about 0.1 micron.
11. The method of claim 10 , wherein probe device yield is maintained greater than about 90%.
12. The method of claim 1 , wherein the tip is oxidation sharpened.
13. The method of claim 1 , wherein the tip is pyramid-shaped.
14. A method for fabricating a probe for a probe microscope comprising the steps of:
etching a region of a silicon wafer to a desired thickness;
depositing silicon nitride on the backside of the etched silicon region;
patterning and etching a tip from the etched silicon region;
patterning and etching a cantilever from the silicon nitride; and
wherein the cantilever has a length of less than about 50 μm and wherein the tip is positioned within about 5 μm of the free end of the cantilever and the effective radius of the tip is less than about 20 nm.
15. The method of claim 14 , wherein the silicon wafer is a bulk single crystal silicon wafer.