Probe microscope setup method

1. A method of performing setup of a probe-based measurement instrument having a probe and a position-affecting controller comprising:

(a) automatically determining at least a plurality of setup operating parameters of the probe-based measurement instrument;

(b) scanning the probe over a sample using the at least plurality of setup operating parameters determined in step (a); and

(c) obtaining sample-related data therefrom;

and wherein none of the setup operating parameters are empirically determined prior to initiating the scanning step.

2. A method of performing setup of a probe-based measurement instrument having a probe and a position-affecting controller comprising:

(a) manually initiating automatic determination of at least a plurality of setup operating parameters of the probe-based measurement instrument;

(b) scanning the probe over a sample using the at least plurality of setup operating parameters determined in step (a);

(c) obtaining sample-related data therefrom, and wherein the automatic setup operating parameter determination step (a) comprises (1) performing automatic parameter tuning, (2) determining a plurality of probe-sample pre-engagement settings, (3) performing automatic gain adjustment, (4) performing a pre-scan of the sample, and thereafter (5) optimizing at least a plurality of pairs of operating parameters.

3. The method of claim 2 , wherein the automatic parameter tuning step (1) comprises (i) oscillating a cantilever of the probe, and (ii) determining a resonant or natural frequency of the cantilever.

4. The method of claim 3 , wherein scan size is set to zero during the automatic parameter tuning step (1).

5. The method of claim 2 , wherein the probe-sample pre-engagement settings determination step (2) comprises (i) checking each operating parameter against a corresponding safe operating parameter setting or setting range, and (ii) adjusting each operating parameter outside the safe operating parameter setting or setting range so it the same as the safe operating parameter setting or lies within the safe operating parameter setting range.

6. The method of claim 5 , wherein the safe operating parameter setting or setting range for at least a plurality of operating parameters is stored in a lookup table.

7. The method of claim 5 , wherein before step (i) the step of checking whether the probe-based measurement instrument has a safe mode and putting the probe-based measurement instrument into safe mode if the probe-based measurement instrument has safe mode capability.

8. The method of claim 5 , wherein steps (i) and (ii) are performed for at least ten operating parameters.

9. The method of claim 8 , wherein steps (i) and (ii) are performed for determining a safe operating parameter setting for at least integral gain, proportional gain, amplitude noise, scan size, scan rate, number of scan lines, offset voltage, and Z-limit.

10. The method of claim 9 , wherein steps (i) and (ii) are also performed for determining a safe operating parameter setting for at least back off percentage, bi-directional pre-scan I-gain, and bi-directional pre-scan P-gain.

11. The method of claim 2 , wherein the automatic gain adjustment step (1) comprises (i) ramping up an integral gain and a proportional gain, (ii) monitoring amplitude noise, (iii) stopping gain ramping when a noise threshold is reached, and thereafter (iv) setting an integral gain operating parameter and (v) setting a proportional gain operating parameter.

12. The method of claim 11 , wherein the integral gain operating parameter set in step (iv) and is based on the integral gain when gain ramping is stopped in step (iii) and the proportional gain operating parameter set in step (v) is based on the proportional gain when gain ramping is stopped in step (iii).

13. The method of claim 12 , wherein gain ramping is stopped in step (iii) when the onset of feedback loop oscillation is detected.