Granted Patent
Utility
US 5,705,814 · App. 08/521,584
Scanning probe microscope having automatic probe exchange and alignment
Inventors:
James M. Young, Craig Prater, David Grigg, Charles Meyer, William H. Hertzog, John A. Gurley, Virgil B. Elings
Patented Case
View Patent ↗
Granted: Jan 6, 1998
Filed: Aug 30, 1995
Inventors
James M. Young
Craig Prater
David Grigg
Charles Meyer
William H. Hertzog
John A. Gurley
Virgil B. Elings
Assignee (at issue)
Digital Instruments, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.